Evaluation of the reasons why freshly appearing citrus peel fluorescence during automatic inspection by fluorescent imaging technique

2011 ◽  
Author(s):  
Md. Abdul Momin ◽  
Naoshi Kondo ◽  
Makoto Kuramoto ◽  
Yuichi Ogawa ◽  
Kazuya Yamamoto ◽  
...  
Keyword(s):  
Imaging Technique ◽  
Fluorescent Imaging ◽  
Automatic Inspection ◽  
Citrus Peel

scholarly journals Watching single molecules in action

eLife ◽  
2014 ◽  
Vol 3 ◽  
Author(s):  
Jordan Monnet ◽  
Terence R Strick
Keyword(s):  
Imaging Technique ◽  
Single Molecules ◽  
Fluorescent Imaging ◽  
Dna Molecule ◽  
Single Dna Molecule

A fluorescent imaging technique called fastFISH has been used to track the various steps involved in the transcription of a single DNA molecule.

scholarly journals Characterizing residue transfer efficiencies using a fluorescent imaging technique

2004 ◽  
Vol 15 (3) ◽  
pp. 261-270 ◽  
Author(s):  
Elaine A Cohen Hubal ◽  
Jack C Suggs ◽  
Marcia G Nishioka ◽  
William A Ivancic
Keyword(s):  
Imaging Technique ◽  
Fluorescent Imaging

scholarly journals Probing in-mouth texture perception with a biomimetic tongue

2019 ◽  
Vol 16 (159) ◽  
pp. 20190362 ◽  
Author(s):  
Jean-Baptiste Thomazo ◽  
Javier Contreras Pastenes ◽  
Christopher J. Pipe ◽  
Benjamin Le Révérend ◽  
Elie Wandersman ◽  
...  
Keyword(s):  
Imaging Technique ◽  
Quantitative Agreement ◽  
Fluorescent Imaging ◽  
Flow Conditions ◽  
Texture Perception ◽  
Proposed Model ◽  
Steady Shear Flow ◽  
Perception Model ◽  
Filiform Papillae ◽  
Newtonian Liquids

An experimental biomimetic tongue–palate system has been developed to probe human in-mouth texture perception. Model tongues are made from soft elastomers patterned with fibrillar structures analogous to human filiform papillae. The palate is represented by a rigid flat plate parallel to the plane of the tongue. To probe the behaviour under physiological flow conditions, deflections of model papillae are measured using a novel fluorescent imaging technique enabling sub-micrometre resolution of the displacements. Using optically transparent Newtonian liquids under steady shear flow, we show that deformations of the papillae allow their viscosity to be determined from 1 Pa s down to the viscosity of water (1 mPa s), in full quantitative agreement with a previously proposed model (Lauga et al. 2016 Front. Phys. 4 , 35 ( doi:10.3389/fphy.2016.00035 )). The technique is further validated for a shear-thinning and optically opaque dairy system.

The dislocation structure of a 10° [110] tilt boundary in silicon

1983 ◽  
Vol 41 ◽  
pp. 114-115
Author(s):  
B. Cunningham ◽  
D.G. Ast
Keyword(s):  
Dislocation Structure ◽  
Tilt Angle ◽  
Imaging Technique ◽  
Diamond Lattice ◽  
Tilt Boundary ◽  
Formation Mechanisms ◽  
Diffraction Contrast ◽  
Lattice Fringe ◽  
Tilt Boundaries ◽  
Chemically Vapor Deposited

There have Been a number of studies of low-angle, θ < 4°, [10] tilt boundaries in the diamond lattice. Dislocations with Burgers vectors a/2<110>, a/2<112>, a<111> and a<001> have been reported in melt-grown bicrystals of germanium, and dislocations with Burgers vectors a<001> and a/2<112> have been reported in hot-pressed bicrystals of silicon. Most of the dislocations were found to be dissociated, the dissociation widths being dependent on the tilt angle. Possible dissociation schemes and formation mechanisms for the a<001> and a<111> dislocations from the interaction of lattice dislocations have recently been given.The present study reports on the dislocation structure of a 10° [10] tilt boundary in chemically vapor deposited silicon. The dislocations in the boundary were spaced about 1-3nm apart, making them difficult to resolve by conventional diffraction contrast techniques. The dislocation structure was therefore studied by the lattice-fringe imaging technique.

X-ray microtomography

1988 ◽  
Vol 46 ◽  
pp. 998-999
Author(s):  
H.W. Deckman ◽  
B.F. Flannery ◽  
J.H. Dunsmuir ◽  
K.D' Amico
Keyword(s):  
Computed Tomography ◽  
Internal Structure ◽  
Imaging Technique ◽  
Three Dimensional ◽  
Tissue Structure ◽  
Individual Element ◽  
X Ray ◽  
Non Invasive ◽  
Panoramic Imaging ◽  
Three Dimensional Images

We have developed a new X-ray microscope which produces complete three dimensional images of samples. The microscope operates by performing X-ray tomography with unprecedented resolution. Tomography is a non-invasive imaging technique that creates maps of the internal structure of samples from measurement of the attenuation of penetrating radiation. As conventionally practiced in medical Computed Tomography (CT), radiologists produce maps of bone and tissue structure in several planar sections that reveal features with 1mm resolution and 1% contrast. Microtomography extends the capability of CT in several ways. First, the resolution which approaches one micron, is one thousand times higher than that of the medical CT. Second, our approach acquires and analyses the data in a panoramic imaging format that directly produces three-dimensional maps in a series of contiguous stacked planes. Typical maps available today consist of three hundred planar sections each containing 512x512 pixels. Finally, and perhaps of most import scientifically, microtomography using a synchrotron X-ray source, allows us to generate maps of individual element.

TEM Study of a Tilt Boundary in Hot-Pressed Silicon

1981 ◽  
Vol 39 ◽  
pp. 160-161
Author(s):  
C. B. Carter ◽  
J. Rose ◽  
D. G. Ast
Keyword(s):  
Electron Diffraction ◽  
Imaging Technique ◽  
Interface Structure ◽  
Large Area ◽  
Weak Beam ◽  
Lattice Fringe ◽  
Electron Diffraction Technique ◽  
Tilt Boundaries ◽  
Beam Technique ◽  
Twist Boundaries

The hot-pressing technique which has been successfully used to manufacture twist boundaries in silicon has now been used to form tilt boundaries in this material. In the present study, weak-beam imaging, lattice-fringe imaging and electron diffraction techniques have been combined to identify different features of the interface structure. The weak-beam technique gives an overall picture of the geometry of the boundary and in particular allows steps in the plane of the boundary which are normal to the dislocation lines to be identified. It also allows pockets of amorphous SiO2 remaining in the interface to be recognized. The lattice-fringe imaging technique allows the boundary plane parallel to the dislocation to be identified. Finally the electron diffraction technique allows the periodic structure of the boundary to be evaluated over a large area - this is particularly valuable when the dislocations are closely spaced - and can also provide information on the structural width of the interface.

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