Characterization of high index microsphere resonators in fiber-integrated microfluidic platforms

2011 ◽  
Author(s):  
Oleksiy Svitelskiy ◽  
Dongning Sun ◽  
Arash Darafsheh ◽  
Mikhail Sumetsky ◽  
Anatoly Lupu ◽  
...  
Keyword(s):  
High Index ◽  
Microfluidic Platforms

Preparation and characterization of microstructured silica holey fibers filled with high-index glasses

2011 ◽  
Author(s):  
J. Kobelke ◽  
R. Spittel ◽  
D. Hoh ◽  
K. Schuster ◽  
A. Schwuchow ◽  
...  
Keyword(s):  
High Index

Dimensional and Locational Integrity in the Replication of Polymeric Microdevices

2007 ◽  
Author(s):  
Byoung Hee You ◽  
Daniel S. Park ◽  
Ping-Chuan Chen ◽  
Wilfredo M. Caceres ◽  
Dimitris E. Nikitopoulos ◽  
...  
Keyword(s):  
Linear Thermal Expansion ◽  
Hot Embossing ◽  
Microtiter Plate ◽  
Microfluidic Platforms ◽  
Molding Process ◽  
Thermal Expansion Coefficients ◽  
Molded Parts ◽  
Expansion Coefficients ◽  
Geometric Variation

In molding, geometric variation of molded parts is inevitable since the parts have a thermal history, including expansion and shrinkage, during the molding process. Shrinkage induces variation between the designed dimensions and locations of features on molded parts while the parts are cooled. Characterization of the variation is necessary to ensure dimensional and location integrity. Hot embossing and injection molding were performed in order to assess variation. Measurements were made using a Measurescope (MM-22, Nikon Corp., Kawasaki, Japan). The measured locations and dimensions were compared to estimates obtained using a simple model based on the linear thermal expansion coefficients (CTE) of the molded materials. The measured and the estimated shrinkage from hot embossing were incorporated in the fabrication of microtiter plate-based polymer microfluidic platforms.

Characterization of Monolayer Oxide Formation Processes on High-Index Si Surfaces by Photoelectron Spectroscopy with Synchrotron Radiation

2013 ◽  
Vol 6 (11) ◽  
pp. 115701 ◽  
Author(s):  
Sosuke Abe ◽  
Shin-ya Ohno ◽  
Rui Kanemura ◽  
Akitaka Yoshigoe ◽  
Yuden Teraoka ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Photoelectron Spectroscopy ◽  
High Index ◽  
Formation Processes ◽  
Oxide Formation

Structural and optical characterization of InAs nanostructures grown on (001) and high index InP substrates

2000 ◽  
Vol 167 (3-4) ◽  
pp. 191-196 ◽  
Author(s):  
Y.F. Li ◽  
X.L. Ye ◽  
F.Q. Liu ◽  
B. Xu ◽  
D. Ding ◽  
...  
Keyword(s):  
Optical Characterization ◽  
High Index ◽  
Inp Substrates

scholarly journals Design, fabrication and characterization of electrostatic micro actuators for microfluidic platforms

2011 ◽  
Vol 25 ◽  
pp. 1181-1184 ◽  
Author(s):  
M. Patrascu ◽  
J. Gonzalo-Ruiz ◽  
M. Goedbloed ◽  
M. Crego-Calama ◽  
S.H. Brongersma
Keyword(s):  
Microfluidic Platforms ◽  
Micro Actuators ◽  
Fabrication And Characterization

Characterization of the geometry of negative dielectrophoresis traps for particle immobilization in digital microfluidic platforms

Lab on a Chip ◽  
2013 ◽  
Vol 13 (9) ◽  
pp. 1823 ◽  
Author(s):  
H. Rezaei Nejad ◽  
Ovee Z. Chowdhury ◽  
Matthew D. Buat ◽  
Mina Hoorfar
Keyword(s):  
Microfluidic Platforms ◽  
Digital Microfluidic

Structural and optical characterization of InAs nanostructures grown on high-index InP substrates

1999 ◽  
Vol 200 (1-2) ◽  
pp. 321-325 ◽  
Author(s):  
Hanxuan Li ◽  
Theda Daniels-Race ◽  
Zhanguo Wang
Keyword(s):  
Optical Characterization ◽  
High Index ◽  
Inp Substrates

Structural and optical characterization of self-assembled InAs-GaAs quantum dots grown on high index surfaces

1997 ◽  
Vol 28 (8-10) ◽  
pp. 933-938 ◽  
Author(s):  
M. Henini ◽  
S. Sanguinetti ◽  
L. Brusaferri ◽  
E. Grilli ◽  
M. Guzzi ◽  
...  
Keyword(s):  
Quantum Dots ◽  
Optical Characterization ◽  
High Index ◽  
Self Assembled

Simple optical characterization of new high index chalcogenide glass

2021 ◽  
Author(s):  
Thomas Hingant ◽  
Pol Briantais ◽  
Raphaël Proux ◽  
Mathieu Rozé ◽  
Petr Němec ◽  
...  
Keyword(s):  
Chalcogenide Glass ◽  
Optical Characterization ◽  
High Index
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