The effect on Strehl ratio from thickness variations in liquid crystal diffractive lenses

2011 ◽  
Author(s):  
Lu Lu ◽  
Lei Shi ◽  
Dwight Duston ◽  
Tony Van Heugten ◽  
Philip J. Bos
Keyword(s):  
Liquid Crystal ◽  
Strehl Ratio ◽  
Diffractive Lenses ◽  
Thickness Variations

scholarly journals Flat liquid crystal diffractive lenses with variable focus and magnification

2010 ◽  
Author(s):  
Pouria Valley ◽  
Mohammad Reza Dodge ◽  
Jim Schwiegerling ◽  
David Mathine ◽  
Gholam Peyman ◽  
...  
Keyword(s):  
Liquid Crystal ◽  
Diffractive Lenses ◽  
Variable Focus

High-Resolution Correction of Arbitrary Wavefront Aberration Using Liquid Crystal Spatial Light Modulator

2011 ◽  
Vol 121-126 ◽  
pp. 877-881
Author(s):  
Hong Xin Zhang ◽  
Xiao Xi Xu
Keyword(s):  
Liquid Crystal ◽  
High Resolution ◽  
Spatial Light Modulator ◽  
Low Cost ◽  
Phase Conjugation ◽  
Astronomical Observation ◽  
Wavefront Aberration ◽  
Strehl Ratio ◽  
Light Modulator ◽  
Wavefront Correction

Wavefront correction plays significant role in some fields like astronomical observation, laser processing and medical imaging, etc. Liquid crystal spatial light modulator ( LC SLM) is an ideal device for high-resolution wavefront correction because of its low cost, low consumption, large number of pixels and independent programming control of each unit. It is researched experimentally that LC SLM is used as a wavefront correction device and corrects arbitrary wavefront aberration. Wavefront correction is performed based on phase conjugation and periodic phase modulation with modulo-2π. The experimental results show that the PV value of the irregular wavefront aberration is 1.56λ, RMS value is 0.25 and Strehl ratio is 0.08 before correction, but the PV value of the residual aberration is reduced to 0.26λ, RMS value is 0.02 and Strehl ratio is increased to 0.97 which is approximated diffraction limit after correction. It is proved to be feasible and effective that LC SLM is used to the high-precision and high-resolution wavefront correction.

The study of diffractive lenses displayed in a phase-only liquid crystal spatial light modulator

2013 ◽  
Author(s):  
Si-jin Ma ◽  
Spozmai Panezai ◽  
Da-yong Wang ◽  
Yun-xin Wang ◽  
Lu Rong
Keyword(s):  
Liquid Crystal ◽  
Spatial Light Modulator ◽  
Light Modulator ◽  
Diffractive Lenses

Effects of Vibration on the Preparation of Ultrathin Sections

1973 ◽  
Vol 31 ◽  
pp. 358-359
Author(s):  
Joseph M. Blum ◽  
Edward P. Gargiulo ◽  
J. R. Sawers
Keyword(s):  
Cutting Speed ◽  
Ground Level ◽  
Environmental Vibration ◽  
Block Face ◽  
Ultrathin Sections ◽  
Embedding Medium ◽  
Thickness Variations ◽  
Building Walls ◽  
Cutting Direction ◽  
Diamond Knife

It is now well-known that chatter (Figure 1) is caused by vibration between the microtome arm and the diamond knife. It is usually observed as a cyclical variation in “optical” density of an electron micrograph due to sample thickness variations perpendicular to the cutting direction. This vibration might be induced by using too large a block face, too large a clearance angle, excessive cutting speed, non-uniform embedding medium or microtome vibration. Another prominent cause is environmental vibration caused by inadequate building construction. Microtomes should be installed on firm, solid floors. The best floors are thick, ground-level concrete pads poured over a sand bed and isolated from the building walls. Even when these precautions are followed, we recommend an additional isolation pad placed on the top of a sturdy table.

Various technic for the measurement of step thickness on crystal surfaces

1978 ◽  
Vol 36 (1) ◽  
pp. 438-439
Author(s):  
C. Boulesteix ◽  
C. Colliex ◽  
C. Mory ◽  
B. Pardo ◽  
D. Renard
Keyword(s):  
Critical Thickness ◽  
Symmetric Case ◽  
Transmitted Intensity ◽  
Crystal Surfaces ◽  
Bright Field ◽  
Excited Wave ◽  
Highly Sensitive ◽  
Contrast Mechanisms ◽  
Step Thickness ◽  
Thickness Variations

Contrast mechanisms, which are responsible of the various types of image formation, are generally thickness dependant. In the following, two imaging modes in the 100 kV CTEM are described : they are highly sensitive to thickness variations and can be used for quantitative estimations of step heights.Detailed calculations (1) of the bright-field intensity have been carried out in the 3 (or 2N+l)-beam symmetric case. They show that in given conditions, the two important symmetric Bloch waves interfere most strongly at a critical thickness for which they have equal emergent amplitudes (the more excited wave at the entrance surface is also the more absorbed). The transmitted intensity I for a Nd2O3 specimen has been calculated as a function of thickness t. The capacity of the method to detect a step and measure its height can be more clearly deduced from a plot of dl/Idt as shown in fig. 1.

Freeze-fracture TEM of the helical smectic A* phase

1992 ◽  
Vol 50 (1) ◽  
pp. 278-279
Author(s):  
K.J. Ihn ◽  
R. Pindak ◽  
J. A. N. Zasadzinski
Keyword(s):  
Liquid Crystal ◽  
Grain Boundary ◽  
Grain Boundaries ◽  
Freeze Fracture ◽  
Smectic Phase ◽  
Layer Spacing ◽  
Screw Dislocations ◽  
Smectic A ◽  
Smectic Phases ◽  
Discrete Amount

A new liquid crystal (called the smectic-A* phase) that combines cholesteric twist and smectic layering was a surprise as smectic phases preclude twist distortions. However, the twist grain boundary (TGB) model of Renn and Lubensky predicted a defect-mediated smectic phase that incorporates cholesteric twist by a lattice of screw dislocations. The TGB model for the liquid crystal analog of the Abrikosov phase of superconductors consists of regularly spaced grain boundaries of screw dislocations, parallel to each other within the grain boundary, but rotated by a fixed angle with respect to adjacent grain boundaries. The dislocations divide the layers into blocks which rotate by a discrete amount, Δθ, given by the ratio of the layer spacing, d, to the distance between grain boundaries, lb; Δθ ≈ d/lb (Fig. 1).

Attractive mode force microscopy of chiral liquid crystal surfaces

1992 ◽  
Vol 50 (1) ◽  
pp. 268-269
Author(s):  
B.D. Terris ◽  
R. J. Twieg ◽  
C. Nguyen ◽  
G. Sigaud ◽  
H. T. Nguyen
Keyword(s):  
Liquid Crystal ◽  
Crystal Surfaces ◽  
Free Surfaces ◽  
Control Range ◽  
Force Microscopy ◽  
Liquid Crystal Films ◽  
Chiral Liquid Crystal ◽  
Crystal Films ◽  
Electrostatic Charging ◽  
And Shifts

We have used a force microscope in the attractive, or noncontact, mode to image a variety of surfaces. In this mode, the microscope tip is oscillated near its resonant frequency and shifts in this frequency due to changes in the surface-tip force gradient are detected. We have used this technique in a variety of applications to polymers, including electrostatic charging, phase separation of ionomer surfaces, and crazing of glassy films.Most recently, we have applied the force microscope to imaging the free surfaces of chiral liquid crystal films. The compounds used (Table 1) have been chosen for their polymorphic variety of fluid mesophases, all of which exist within the temperature control range of our force microscope.

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