Detection of calculus by laser-induced breakdown spectroscopy (LIBS) using an ultra-short pulse laser system (USPL)

2011 ◽  
Author(s):  
F. Schelle ◽  
O. Brede ◽  
S. Krueger ◽  
B. Oehme ◽  
C. Dehn ◽  
...  
2014 ◽  
Vol 29 (6) ◽  
pp. 1082-1089 ◽  
Author(s):  
Xiaobo Zhang ◽  
Yoshihiro Deguchi ◽  
Zhenzhen Wang ◽  
Junjie Yan ◽  
Jiping Liu

Iodine in buffer gases of air and N2 was measured under various conditions including different wavelengths, laser powers, pulse widths and pressures to compare the detection characteristics of low pressure and short pulse LIBS.


2013 ◽  
Vol 49 (5) ◽  
pp. 364-366
Author(s):  
A. Alhazime ◽  
Y. Ding ◽  
D.I. Nikitichev ◽  
K.A. Fedorova ◽  
I.L. Krestnikov ◽  
...  

Author(s):  
F. Beaudoin ◽  
P. Perdu ◽  
C. DeNardi ◽  
R. Desplats ◽  
J. Lopez ◽  
...  

Abstract Ultra-short pulse laser ablation is applied to IC backside sample preparation. It is contact-less, non-thermal, precise and can ablate the various types of material present in IC packages. This study concerns the optimization of ultra-short pulse laser ablation for silicon thinning. Uncontrolled silicon roughness and poor uniformity of the laser thinned cavity needed to be tackled. Special care is taken to minimize the silicon RMS roughness to less than 1µm. Application to sample preparation of 256Mbit devices is presented.


1994 ◽  
Author(s):  
Ronnie Shepherd ◽  
Rex Booth ◽  
Dwight Price ◽  
Rosemary Walling ◽  
Richard More ◽  
...  

2005 ◽  
Author(s):  
Andreas Hertwig ◽  
Sven Martin ◽  
Wolfgang Kautek ◽  
Jörg Krüger

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