Time resolved spectroscopy on quantum dots and graphene at the FELBE free-electron laser

2011 ◽  
Author(s):  
S. Winnerl ◽  
D. Stehr ◽  
M. Wagner ◽  
H. Schneider ◽  
M. Helm ◽  
...  
2015 ◽  
Vol 22 (3) ◽  
pp. 553-564 ◽  
Author(s):  
Claudio Masciovecchio ◽  
Andrea Battistoni ◽  
Erika Giangrisostomi ◽  
Filippo Bencivenga ◽  
Emiliano Principi ◽  
...  

The Elastic and Inelastic Scattering (EIS) beamline at the free-electron laser FERMI is presented. It consists of two separate end-stations: EIS-TIMEX, dedicated to ultrafast time-resolved studies of matter under extreme and metastable conditions, and EIS-TIMER, dedicated to time-resolved spectroscopy of mesoscopic dynamics in condensed matter. The scientific objectives are discussed and the instrument layout illustrated, together with the results from first exemplifying experiments.


2003 ◽  
Vol 770 ◽  
Author(s):  
N.Q. Vinh ◽  
T. Gregorkiewicz

AbstractOne of the open questions in semiconductor physics is the origin of the small splittings of the excited states of bound excitons in silicon. A free electron laser as a tunable source of the mid-infrared radiation (MIR) can be used to investigate such splittings of the excited states of optical centers created by transition metal dopants in silicon. In the current study, the photoluminescence from silver and copper doped silicon is investigated by two color spectroscopy in the visible and the MIR. It is shown the PL due recombination of exciton bound to Ag and Cu is quenched upon application of the MIR beam. The time-resolved photoluminescence measurements and the quenching effects of these bands are presented. By scanning the wavelength of the free-electron laser ionization spectra of relevant traps involved in photoluminescence are obtained. The formation and dissociation of the bound excitons, and the small splittings of the effective-mass excited states are discussed. The applied experimental method allows correlation of DLTS data on trapping centers to specific channels of radiative recombination. It can be applied for spectroscopic analysis in materials science of semicondutors.


2010 ◽  
Vol 81 (3) ◽  
Author(s):  
S. Y. Liu ◽  
Y. Ogi ◽  
T. Fuji ◽  
K. Nishizawa ◽  
T. Horio ◽  
...  

2001 ◽  
Vol 105 (35) ◽  
pp. 8281-8284 ◽  
Author(s):  
Wilfried G. J. H. M. van Sark ◽  
Patrick L. T. M. Frederix ◽  
Dave J. Van den Heuvel ◽  
Hans C. Gerritsen ◽  
Ageeth A. Bol ◽  
...  

Author(s):  
Marius Schmidt ◽  
Suraj Pandey ◽  
Adrian Mancuso ◽  
Richard Bean

Abstract This protocol introduces step by step into the collection of time resolved crystallographic data and their analysis at the European Free Electron Laser.


1998 ◽  
Vol 2 (1-4) ◽  
pp. 588-593 ◽  
Author(s):  
Ph Roussignol ◽  
W Heller ◽  
A Filoramo ◽  
U Bockelmann

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