Demonstrations of beam quality of semiconductor lasers

2010 ◽  
Author(s):  
Changqing Cao ◽  
Xiaodong Zeng ◽  
Yuying An
Keyword(s):  
Semiconductor Lasers ◽  
Beam Quality

Beam Quality of High Power Vertical-Cavity Bottom-Emitting Semiconductor Lasers

2011 ◽  
Vol 38 (1) ◽  
pp. 0102002
Author(s):  
崔锦江 Cui Jinjiang ◽  
宁永强 Ning Yongqiang ◽  
姜琛昱 Jiang Chenyu ◽  
王帆 Wang Fan ◽  
高静 Gao Jing ◽  
...  
Keyword(s):  
Semiconductor Lasers ◽  
High Power ◽  
Beam Quality ◽  
Cavity Bottom ◽  
Vertical Cavity

Measurement and analysis of wavefront structures of diode lasers

2017 ◽  
Vol 84 (1) ◽  
Author(s):  
Inga-Maria Eichentopf ◽  
Martin Reufer
Keyword(s):  
Semiconductor Lasers ◽  
Near Infrared ◽  
Beam Quality ◽  
Laser Beams ◽  
Modal Composition ◽  
Wavefront Analysis ◽  
Measurement And Analysis ◽  
Laser Sources ◽  
Insight Into

AbstractIn order to analyze the beam quality of laser sources wavefront measurements using a Shack–Hartmann sensor became an established way. With the detection of the wavefront deflection a change of the modal composition of the laser beam can be recorded directly. While this method is well known for nearly Gaussian laser beams, the wavefront analysis of broadarea semiconductor lasers is an open field of current research. Detailed analysis of the wavefront gives an additional path to get an insight into the transverse modal composition of semiconductor lasers, which have a dominant impact on the output parameters of the devices. For the presented investigations lasers emitting light in the near infrared (

Discussion of beam quality of semiconductor lasers

2015 ◽  
Author(s):  
Chang-Qing Cao ◽  
Xiao-Dong Zeng ◽  
Xiang Wang ◽  
Zhi Lai ◽  
Long Luo
Keyword(s):  
Semiconductor Lasers ◽  
Beam Quality

scholarly journals Evaluating the beam quality of semiconductor lasers

2012 ◽  
Vol 30 (3) ◽  
pp. 276-278
Author(s):  
Chang-Qing CAO ◽  
Xiao-Dong ZENG
Keyword(s):  
Semiconductor Lasers ◽  
Beam Quality

scholarly journals 1178 J, 527 nm near diffraction limited laser based on a complete closed-loop adaptive optics controlled off-axis multi-pass amplification laser system

2021 ◽  
Vol 9 ◽  
Author(s):  
Deen Wang ◽  
Xin Zhang ◽  
Wanjun Dai ◽  
Ying Yang ◽  
Xuewei Deng ◽  
...  
Keyword(s):  
Laser Beam ◽  
Adaptive Optics ◽  
Closed Loop ◽  
Focal Spot ◽  
Beam Quality ◽  
Laser System ◽  
Diffraction Limit ◽  
Kdp Crystal ◽  
Main Amplifier

Abstract A 1178 J near diffraction limited 527 nm laser is realized in a complete closed-loop adaptive optics (AO) controlled off-axis multi-pass amplification laser system. Generated from a fiber laser and amplified by the pre-amplifier and the main amplifier, a 1053 nm laser beam with the energy of 1900 J is obtained and converted into a 527 nm laser beam by a KDP crystal with 62% conversion efficiency, 1178 J and beam quality of 7.93 times the diffraction limit (DL). By using a complete closed-loop AO configuration, the static and dynamic wavefront distortions of the laser system are measured and compensated. After correction, the diameter of the circle enclosing 80% energy is improved remarkably from 7.93DL to 1.29DL. The focal spot is highly concentrated and the 1178 J, 527 nm near diffraction limited laser is achieved.

Beam quality of photonic-crystal fibers

2005 ◽  
Vol 23 (7) ◽  
pp. 2267-2270 ◽  
Author(s):  
A. Mafi ◽  
J.V. Moloney
Keyword(s):  
Photonic Crystal ◽  
Photonic Crystal Fibers ◽  
Beam Quality ◽  
Crystal Fibers

scholarly journals Improvement of the spatial beam quality of laser sources with an intracavity Bragg grating

2003 ◽  
Vol 28 (4) ◽  
pp. 242 ◽  
Author(s):  
Sylvie Yiou ◽  
François Balembois ◽  
Patrick Georges ◽  
Jean-Pierre Huignard
Keyword(s):  
Beam Quality ◽  
Bragg Grating ◽  
Spatial Beam ◽  
Laser Sources
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