Verification of the controllability of refractive index by subwavelength structure fabricated by photolithography: toward single-material mid- and far-infrared multilayer filters

2010 ◽  
Author(s):  
Hironobu Makitsubo ◽  
Takehiko Wada ◽  
Makoto Mita
Keyword(s):  
Refractive Index ◽  
Far Infrared ◽  
Subwavelength Structure ◽  
Multilayer Filters ◽  
Single Material

scholarly journals Broadband spectroscopy of astrophysical ice analogues

2019 ◽  
Vol 629 ◽  
pp. A112 ◽  
Author(s):  
B. M. Giuliano ◽  
A. A. Gavdush ◽  
B. Müller ◽  
K. I. Zaytsev ◽  
T. Grassi ◽  
...  
Keyword(s):  
Refractive Index ◽  
Optical Properties ◽  
Time Domain ◽  
Complex Refractive Index ◽  
Far Infrared ◽  
Infrared Region ◽  
Thz Radiation ◽  
The Real ◽  
Thz Range ◽  
The Time Domain

Context. Reliable, directly measured optical properties of astrophysical ice analogues in the infrared and terahertz (THz) range are missing from the literature. These parameters are of great importance to model the dust continuum radiative transfer in dense and cold regions, where thick ice mantles are present, and are necessary for the interpretation of future observations planned in the far-infrared region. Aims. Coherent THz radiation allows for direct measurement of the complex dielectric function (refractive index) of astrophysically relevant ice species in the THz range. Methods. We recorded the time-domain waveforms and the frequency-domain spectra of reference samples of CO ice, deposited at a temperature of 28.5 K and annealed to 33 K at different thicknesses. We developed a new algorithm to reconstruct the real and imaginary parts of the refractive index from the time-domain THz data. Results. The complex refractive index in the wavelength range 1 mm–150 μm (0.3–2.0 THz) was determined for the studied ice samples, and this index was compared with available data found in the literature. Conclusions. The developed algorithm of reconstructing the real and imaginary parts of the refractive index from the time-domain THz data enables us, for the first time, to determine the optical properties of astrophysical ice analogues without using the Kramers–Kronig relations. The obtained data provide a benchmark to interpret the observational data from current ground-based facilities as well as future space telescope missions, and we used these data to estimate the opacities of the dust grains in presence of CO ice mantles.

Refractive index of flames in the far infrared

1973 ◽  
Vol 6 (6) ◽  
pp. 774-780 ◽  
Author(s):  
G Hubner ◽  
A R Jones
Keyword(s):  
Refractive Index ◽  
Far Infrared

Single‐Material, Near‐Infrared Selective Absorber Based on Refractive Index‐Tunable Tamm Plasmon Structure

2022 ◽  
pp. 2102388
Author(s):  
So Hee Kim ◽  
Joo Hwan Ko ◽  
Young Jin Yoo ◽  
Min Seok Kim ◽  
Gil Ju Lee ◽  
...  
Keyword(s):  
Refractive Index ◽  
Near Infrared ◽  
Single Material

Refractive Index of GaS in the Far Infrared

1978 ◽  
Vol 87 (1) ◽  
pp. K65-K67 ◽  
Author(s):  
V. Riede ◽  
Hoang Xuan Nguyen ◽  
H. Neumann ◽  
H. Sobotta ◽  
F. Levy
Keyword(s):  
Refractive Index ◽  
Far Infrared

Far-Infrared Spectroscopic Study of Diamond Films

1989 ◽  
Vol 162 ◽  
Author(s):  
A. J. Gatesman ◽  
R. H. Giles ◽  
G. C. Phillips ◽  
J. Waldman ◽  
L. P. Bourget ◽  
...  
Keyword(s):  
Refractive Index ◽  
Spectroscopic Study ◽  
Microwave Plasma ◽  
Complex Refractive Index ◽  
Diamond Films ◽  
Far Infrared ◽  
Infrared Spectroscopic Study ◽  
Infrared Spectroscopic ◽  
Frequency Regime ◽  
Reflectivity Data

High quality polycrystalline diamond films grown on Si substrates by microwave plasma enhanced chemical vapor deposition were characterized in a far-infrared spectroscopic study. The spectroscopic transmissivity data were used to derive a model for the complex refractive index (n – ik) as a function of wavelength in the 10 to 200 cm−1 frequency regime. Similar transmissivity and reflectivity data from samples of varying thickness were used to validate this model. The continuum of measured transmissivity and reflectivity data from 10 to 200 cm−1 were shown to be in excellent agreement with the values calculated from the refractive index model. The films were shown to have low loss in this frequency regime.

Electron thermalization distance distribution and ion mobility in n-C6F14

1992 ◽  
Vol 70 (3) ◽  
pp. 915-918
Author(s):  
Takehisa Yoshinari ◽  
Gordon R. Freeman
Keyword(s):  
Refractive Index ◽  
Ion Mobility ◽  
Far Infrared ◽  
Distance Distribution ◽  
Liquid Density ◽  
Distance Distribution Function ◽  
Electric Field Dependence ◽  
Free Volume Model ◽  
Fluorine Compounds ◽  
Ion Yields

Electron thermalization distances in liquid n-C6F14 were estimated from the electric field dependence of the free-ion yields at 0.3 ≤ E (MV/m) ≤ 3.7 and densities 1564 ≤ d (kg/m3) ≤ 1951; the latter correspond to 335.4 ≥ T (K) ≥ 191.3. The distance distribution function that best fits the data has a Gaussian body and power tail (YGP), the same as in n-alkanes and in C6F6 and SF6, but different from those in the liquids N2, CO, and CS2. The latter apparently capture electrons at higher energies than do the fluorine compounds. The static relative permittivity of liquid n-C6F14 was measured as a function of temperature and compared with the square of the refractive index and the Debye and Clausius–Mosotti equations. Atomic polarization appears to contribute 6% to the refractive index in the far infrared. Cation mobilities at temperatures 335.4 ≥ T (K) ≥ 191.2 are fitted by the free volume model, with v0 = 1.71 × 10−4 m3/mol and Ev = 3.24 kJ/mol. Keywords: electron, ion, liquid density, permittivity, mobility, n-C6F14, thermalization distance.

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