Flagging and correction of pattern noise in the Kepler focal plane array

Residual fixed pattern noise and random telegraph signal noise of a MWIR T2SL focal plane array

Infrared Technology and Applications XLV ◽

10.1117/12.2520211 ◽

2019 ◽

Author(s):

Isabelle Ribet-Mohamed ◽

Vignesh Arounassalame ◽

Jean Nghiem ◽

Marcel Caes ◽

Maxence Guénin ◽

...

Keyword(s):

Focal Plane ◽

Focal Plane Array ◽

Random Telegraph Signal ◽

Signal Noise ◽

Pattern Noise ◽

Fixed Pattern Noise

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Acceleration algorithm for constant-statistics method applied to the nonuniformity correction of infrared sequences

Opto-Electronics Review ◽

10.1515/oere-2015-0014 ◽

2015 ◽

Vol 23 (1) ◽

Cited By ~ 3

Author(s):

A.G. Jara Chavez ◽

F.O. Torres Vicencio

Keyword(s):

Focal Plane ◽

Focal Plane Array ◽

Higher Order ◽

Video Sequences ◽

Nonuniformity Correction ◽

Infrared Focal Plane Array ◽

Order Filter ◽

Pattern Noise ◽

Infrared Video ◽

Infrared Cameras

AbstractNon−uniformity noise, it was, it is, and it will probably be one of the most non−desired attached companion of the infrared focal plane array (IRFPA) data. We present a higher order filter where the key advantage is based in its capacity to estimates the detection parameters and thus to compensate it for fixed pattern noise, as an enhancement of Constant Statistics (CS) theory. This paper shows a technique to improve the convergence in accelerated way for CS (AACS: Acceleration Algorithm for Constant Statistics). The effectiveness of this method is demonstrated by using simulated infrared video sequences and several real infrared video sequences obtained using two infrared cameras.

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Non-uniformity correction in a Long Wave Infrared Focal Plane Array as a calibration temperature function

Journal of Integrated Circuits and Systems ◽

10.29292/jics.v14i3.64 ◽

2019 ◽

Vol 14 (3) ◽

pp. 1-6

Author(s):

Augusto Cezar Gomes Dos Santos ◽

Gustavo Soares Vieira ◽

Ruy Morgado De Castro

Keyword(s):

Focal Plane ◽

Large Deviation ◽

Test Procedure ◽

Focal Plane Array ◽

Temperature Function ◽

Pattern Noise ◽

Spatial Noise ◽

Noise Equivalent Temperature Difference ◽

Signal Transfer Function ◽

Long Wave Infrared

Despite of the manufactory process, all detector or pixel in a Focal Plane Array (FPA) has a different responsivity and offset when evaluated. These variations result in a specific kind of noise, called Fixed Pattern Noise (FPN) or spatial noise. During the image processing, those pixels who has a large deviation in responsivity or in their noise are considered bad pixels, and have their influence removed during the exhibition of a scene. Knowing the answer of all those pixels are the first test procedure in an FPA characterization. However, during the Non-uniformity correction and bad pixel replacement it is necessary to choose two reference temperatures, calibration points, and those temperature affects important parameters such as Uniformity, Noise Equivalent Temperature Difference (NETD) and Signal Transfer Function (SiTF). This work will study the calibration temperature influence on the Non-Uniformity Correction (NUC) quality by comparing uniformity, bad pixel number, NETD and SiTF values during characterizations.

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