Instrument calibration and lineshape modeling for ultraspectral imagery measurements of industrial smokestack emissions

2010 ◽  
Author(s):  
Kevin C. Gross ◽  
Pierre Tremblay ◽  
Kenneth C. Bradley ◽  
Martin Chamberland ◽  
Vincent Farley ◽  
...  
Keyword(s):  
Instrument Calibration ◽  
Smokestack Emissions

Distortion in lattice-resolution scanned-probe microscope images

1993 ◽  
Vol 51 ◽  
pp. 522-523
Author(s):  
L. Fei
Keyword(s):  
Film Studies ◽  
Lattice Structure ◽  
Substrate Material ◽  
Repulsive Force ◽  
Instrument Calibration ◽  
Microscope Images ◽  
Probe Microscope ◽  
Electron Microscopes ◽  
Diffraction Patterns ◽  
Lattice Resolution

Scanned probe microscopes (SPM) have been widely used for studying the structure of a variety material surfaces and thin films. Interpretation of SPM images, however, remains a debatable subject at best. Unlike electron microscopes (EMs) where diffraction patterns and images regularly provide data on lattice spacings and angles within 1-2% and ∽1° accuracy, our experience indicates that lattice distances and angles in raw SPM images can be off by as much as 10% and ∽6°, respectively. Because SPM images can be affected by processes like the coupling between fast and slow scan direction, hysteresis of piezoelectric scanner, thermal drift, anisotropic tip and sample interaction, etc., the causes for such a large discrepancy maybe complex even though manufacturers suggest that the correction can be done through only instrument calibration.We show here that scanning repulsive force microscope (SFM or AFM) images of freshly cleaved mica, a substrate material used for thin film studies as well as for SFM instrument calibration, are distorted compared with the lattice structure expected for mica.

Making Known Concentrations for Instrument Calibration

AIHAJ ◽  
1961 ◽  
Vol 22 (5) ◽  
pp. 392-402 ◽  
Author(s):  
H. N. Cotabish ◽  
P. W. McConnaughey ◽  
H. C. Messer
Keyword(s):  
Instrument Calibration

scholarly journals The acceptable range of roughness instrument calibration factor

2021 ◽  
Vol 1816 (1) ◽  
pp. 012028
Author(s):  
A Rahman ◽  
N Alfiyati ◽  
O Novyanto ◽  
N L Kartika ◽  
R Z Amdani
Keyword(s):  
Calibration Factor ◽  
Instrument Calibration ◽  
Acceptable Range

Satellite Instrument Calibration for Measuring Global Climate Change: Report of a Workshop

2005 ◽  
Vol 86 (9) ◽  
pp. 1303-1314 ◽  
Author(s):  
George Ohring ◽  
Bruce Wielicki ◽  
Roy Spencer ◽  
Bill Emery ◽  
Raju Datla
Keyword(s):  
Climate Change ◽  
Global Climate Change ◽  
Global Climate ◽  
Instrument Calibration
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