Portable open-path optical remote sensing (ORS) Fourier transform infrared (FTIR) instrumentation miniaturization and software for point and click real-time analysis

2010 ◽  
Author(s):  
Peter G. Zemek ◽  
Steven V. Plowman
Keyword(s):  
Remote Sensing ◽  
Fourier Transform ◽  
Real Time ◽  
Fourier Transform Infrared ◽  
Optical Remote Sensing ◽  
Time Analysis ◽  
Real Time Analysis ◽  
Open Path

Simultaneous Real-Time Analysis of Bulk and Bottom Cure of Ultraviolet-Curable Inks Using Fourier Transform Infrared Spectroscopy

2017 ◽  
Vol 71 (12) ◽  
pp. 2699-2706 ◽  
Author(s):  
Hennie A.L. Boonen ◽  
Janou A. Koskamp ◽  
Wolfgang Theiss ◽  
Piet D. Iedema ◽  
Robin X.E. Willemse
Keyword(s):  
Fourier Transform ◽  
Real Time ◽  
Uv Curing ◽  
Fourier Transform Infrared ◽  
Attenuated Total Reflection ◽  
Analysis Method ◽  
Real Time Analysis ◽  
Curing Characteristics ◽  
Ultraviolet Curable ◽  
Ft Ir

The curing characteristics of an ultraviolet (UV) ink layer are of utmost importance for the development of UV inks. Measuring either bulk or bottom cure in itself is not new and has been the subject of many articles. In this article, two methods are described based on Fourier transform infrared (FT-IR) spectrometry to measure in real time and simultaneously the bulk and bottom cure of a thin UV ink layer. The procedure consists of applying a thin (10–12 µm) layer of UV-curing ink on an attenuated total reflection (ATR) crystal. The bottom cure is measured with ATR. The bulk cure is measured simultaneously with a reflection analysis (method 1) or a transmission analysis (method 2). With both methods, the bulk and bottom cure can be determined. To overcome problems with the interference in the ATR reflection setup, it is recommended to use the ATR transmission setup.

An Interactive Minicomputer Program for the Indexing and Simulation of Electron Diffraction Patterns

1976 ◽  
Vol 34 ◽  
pp. 542-543
Author(s):  
R.P. Goehner ◽  
W.T. Hatfield ◽  
Prakash Rao
Keyword(s):  
Electron Diffraction ◽  
Real Time ◽  
Pattern Analysis ◽  
Flow Diagram ◽  
Hard Copy ◽  
Time Analysis ◽  
Real Time Analysis ◽  
Transmission Electron ◽  
One Step ◽  
Diffraction Patterns

Computer programs are now available in various laboratories for the indexing and simulation of transmission electron diffraction patterns. Although these programs address themselves to the solution of various aspects of the indexing and simulation process, the ultimate goal is to perform real time diffraction pattern analysis directly off of the imaging screen of the transmission electron microscope. The program to be described in this paper represents one step prior to real time analysis. It involves the combination of two programs, described in an earlier paper(l), into a single program for use on an interactive basis with a minicomputer. In our case, the minicomputer is an INTERDATA 70 equipped with a Tektronix 4010-1 graphical display terminal and hard copy unit.A simplified flow diagram of the combined program, written in Fortran IV, is shown in Figure 1. It consists of two programs INDEX and TEDP which index and simulate electron diffraction patterns respectively. The user has the option of choosing either the indexing or simulating aspects of the combined program.

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