Radiation source considerations relevant to next-generation x-ray diffraction imaging for security screening applications

2009 ◽  
Author(s):  
G. Harding ◽  
H. Strecker ◽  
S. Olesinski ◽  
K. Frutschy
Keyword(s):  
Generation X ◽  
Radiation Source ◽  
Next Generation ◽  
X Ray Diffraction ◽  
Security Screening ◽  
X Ray ◽  
Diffraction Imaging

X-ray diffraction imaging with the Multiple Inverse Fan Beam topology: Principles, performance and potential for security screening

2012 ◽  
Vol 70 (7) ◽  
pp. 1228-1237 ◽  
Author(s):  
G. Harding ◽  
H. Fleckenstein ◽  
D. Kosciesza ◽  
S. Olesinski ◽  
H. Strecker ◽  
...  
Keyword(s):  
X Ray Diffraction ◽  
Security Screening ◽  
X Ray ◽  
Diffraction Imaging

Development of a novel apparatus for experiments in soft X-ray diffraction imaging and diffraction tomography

2003 ◽  
Vol 104 ◽  
pp. 27-30 ◽  
Author(s):  
T. Beetz ◽  
C. Jacobsen ◽  
C.-C. Kao ◽  
J. Kirz ◽  
O. Mentes ◽  
...  
Keyword(s):  
Diffraction Tomography ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Imaging

scholarly journals Simultaneous Multi-Bragg Peak Coherent X-ray Diffraction Imaging

Crystals ◽  
2021 ◽  
Vol 11 (3) ◽  
pp. 312
Author(s):  
Florian Lauraux ◽  
Stéphane Labat ◽  
Sarah Yehya ◽  
Marie-Ingrid Richard ◽  
Steven J. Leake ◽  
...  
Keyword(s):  
Bragg Reflection ◽  
Volume Ratio ◽  
X Ray Diffraction ◽  
X Ray ◽  
Crystal Substrate ◽  
In Series ◽  
Diffraction Imaging ◽  
Diffraction Patterns ◽  
Lattice Planes ◽  
Oriented Parallel

The simultaneous measurement of two Bragg reflections by Bragg coherent X-ray diffraction is demonstrated on a twinned Au crystal, which was prepared by the solid-state dewetting of a 30 nm thin gold film on a sapphire substrate. The crystal was oriented on a goniometer so that two lattice planes fulfill the Bragg condition at the same time. The Au 111 and Au 200 Bragg peaks were measured simultaneously by scanning the energy of the incident X-ray beam and recording the diffraction patterns with two two-dimensional detectors. While the former Bragg reflection is not sensitive to the twin boundary, which is oriented parallel to the crystal–substrate interface, the latter reflection is only sensitive to one part of the crystal. The volume ratio between the two parts of the twinned crystal is about 1:9, which is also confirmed by Laue microdiffraction of the same crystal. The parallel measurement of multiple Bragg reflections is essential for future in situ and operando studies, which are so far limited to either a single Bragg reflection or several in series, to facilitate the precise monitoring of both the strain field and defects during the application of external stimuli.

scholarly journals X-ray imaging of silicon die within fully packaged semiconductor devices

2021 ◽  
pp. 1-7
Author(s):  
Brian K. Tanner ◽  
Patrick J. McNally ◽  
Andreas N. Danilewsky
Keyword(s):  
Synchrotron Radiation ◽  
Feasibility Studies ◽  
Monochromatic Radiation ◽  
X Ray Diffraction ◽  
Divergent Beam ◽  
X Ray ◽  
X Ray Imaging ◽  
Setting Process ◽  
Diffraction Imaging ◽  
Lattice Planes

X-ray diffraction imaging (XRDI) (topography) measurements of silicon die warpage within fully packaged commercial quad-flat no-lead devices are described. Using synchrotron radiation, it has been shown that the tilt of the lattice planes in the Analog Devices AD9253 die initially falls, but after 100 °C, it rises again. The twist across the die wafer falls linearly with an increase in temperature. At 200 °C, the tilt varies approximately linearly with position, that is, displacement varies quadratically along the die. The warpage is approximately reversible on cooling, suggesting that it has a simple paraboloidal form prior to encapsulation; the complex tilt and twisting result from the polymer setting process. Feasibility studies are reported, which demonstrate that a divergent beam and quasi-monochromatic radiation from a sealed X-ray tube can be used to perform warpage measurements by XRDI in the laboratory. Existing tools have limitations because of the geometry of the X-ray optics, resulting in applicability only to simple warpage structures. The necessary modifications required for use in situations of complex warpage, for example, in multiple die interconnected packages are specified.

Experimental Qualification of a Novel X-Ray Diffraction Imaging Setup Based on Polycapillary X-Ray Optics

2010 ◽  
Vol 57 (5) ◽  
pp. 2564-2570 ◽  
Author(s):  
A. Castoldi ◽  
C. Ozkan ◽  
C. Guazzoni ◽  
A. Bjeoumikhov ◽  
R. Hartmann
Keyword(s):  
X Ray Diffraction ◽  
Ray Optics ◽  
X Ray ◽  
Diffraction Imaging ◽  
Imaging Setup

Full-field X-ray diffraction microscopy using polymeric compound refractive lenses

2014 ◽  
Vol 47 (6) ◽  
pp. 1882-1888 ◽  
Author(s):  
J. Hilhorst ◽  
F. Marschall ◽  
T. N. Tran Thi ◽  
A. Last ◽  
T. U. Schülli
Keyword(s):  
Imaging Techniques ◽  
Light And Electron Microscopy ◽  
Added Value ◽  
Acquisition Time ◽  
Imaging Method ◽  
X Ray Diffraction ◽  
Polymeric Compound ◽  
Full Field ◽  
X Ray ◽  
Diffraction Imaging

Diffraction imaging is the science of imaging samples under diffraction conditions. Diffraction imaging techniques are well established in visible light and electron microscopy, and have also been widely employed in X-ray science in the form of X-ray topography. Over the past two decades, interest in X-ray diffraction imaging has taken flight and resulted in a wide variety of methods. This article discusses a new full-field imaging method, which uses polymer compound refractive lenses as a microscope objective to capture a diffracted X-ray beam coming from a large illuminated area on a sample. This produces an image of the diffracting parts of the sample on a camera. It is shown that this technique has added value in the field, owing to its high imaging speed, while being competitive in resolution and level of detail of obtained information. Using a model sample, it is shown that lattice tilts and strain in single crystals can be resolved simultaneously down to 10−3° and Δa/a= 10−5, respectively, with submicrometre resolution over an area of 100 × 100 µm and a total image acquisition time of less than 60 s.

scholarly journals Cryogenic Coherent X-ray Diffraction Imaging Techniques for Structural Analyses of Biological Cells and Cellular Organelles

2018 ◽  
Vol 24 (S2) ◽  
pp. 14-15
Author(s):  
Amane Kobayashi ◽  
Yuki Takayama ◽  
Tomotaka Oroguchi ◽  
Koji Okajima ◽  
Mao Oide ◽  
...  
Keyword(s):  
Imaging Techniques ◽  
Biological Cells ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Imaging ◽  
Cellular Organelles

PFM2: a 32 × 32 processor for X-ray diffraction imaging at FELs

2016 ◽  
Vol 11 (11) ◽  
pp. C11033-C11033
Author(s):  
M. Manghisoni ◽  
L. Fabris ◽  
V. Re ◽  
G. Traversi ◽  
L. Ratti ◽  
...  
Keyword(s):  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Imaging
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