Electron spin resonance spectroscopy investigation of ion beam sputtered HfO 2 and SiO 2 thin films

Author(s):  
B. Langdon ◽  
D. Patel ◽  
E. Krous ◽  
P. Langston ◽  
C. S. Menoni ◽  
...  
2012 ◽  
Vol 47 (8) ◽  
pp. 640-643 ◽  
Author(s):  
Wanwisa Sudprasert ◽  
Sahakan Monthonwattana ◽  
Arag Vitittheeranon

Sign in / Sign up

Export Citation Format

Share Document