Evanescent Intensity Of A Focused Gaussian Light Beam Undergoing Total Internal Reflection In A Prism

1984 ◽  
Vol 23 (1) ◽  
Author(s):  
Thomas P. Burghardt ◽  
Nancy L. Thompson
2007 ◽  
Vol 15 (25) ◽  
pp. 17392 ◽  
Author(s):  
Takehiro Fukushima ◽  
Susumu Shinohara ◽  
Takahisa Harayama

2012 ◽  
Vol 59 (7) ◽  
pp. 643-649
Author(s):  
Xiangmin Liu ◽  
Yan Shi ◽  
Pengfei Zhu ◽  
Yanli Zhang ◽  
Qingfen Yang

Author(s):  
Douglas Heymann ◽  
Jordan Young ◽  
Ruander Cardenas

Void fraction measurements are used to characterize two-phase flow within a microchannel. Limitations of typical void fraction measurement systems include disruption of the flow (intrusive optical probe) and non-continuous data acquisition. Using the principles of total internal reflection, a Non-Intrusive Void Incidence Sensor (NIVIS) has been developed to determine the void incidence (frequency of a vapor bubble passing a known position in the channel). Continuous data can be recorded with a typical computer. A light beam is introduced through a fiber optic to the outside of a transparent channel wall at a critical angle. This critical angle is designed such that when a vapor bubble is present at the specified location, total internal reflection will occur. An output fiber is fixed in a determined position to receive light in the case of total internal reflection. Without the presence of a vapor bubble, the light beam will be reflected past the output fiber. A substantial increase in output signal is noticed when total internal reflection occurs. Characteristics of the NIVIS, proven during non-intrusive testing, include: continuous data acquisition of bubble incidences, measurements within a 100 micron wide channel, and bubble boundary differentiation.


1999 ◽  
Vol 44 (4) ◽  
pp. 417-421
Author(s):  
P. D. Kukharchik ◽  
V. M. Serdyuk ◽  
I. A. Titovitskii

2020 ◽  
pp. 44-49
Author(s):  
I. N. Pavlov

Two optical methods, namely surface plasmon resonance imaging and frustrated total internal reflection, are described in the paper in terms of comparing their sensitivity to change of refractive index of a thin boundary layer of an investigated medium. It is shown that, despite the fact that the theoretically calculated sensitivity is higher for the frustrated total internal reflection method, and the fact that usually in practice the surface plasmon resonance method, on the contrary, is considered more sensitive, under the same experimental conditions both methods show a similar result.


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