Integrated 1060nm MOPA pump source for high-power green light emitters in display technology

Author(s):  
O. Brox ◽  
J. Wiedmann ◽  
F. Scholz ◽  
F. Bugge ◽  
J. Fricke ◽  
...  
Nano Letters ◽  
2016 ◽  
Vol 16 (2) ◽  
pp. 1056-1063 ◽  
Author(s):  
Chao Zhao ◽  
Tien Khee Ng ◽  
Nini Wei ◽  
Aditya Prabaswara ◽  
Mohd S. Alias ◽  
...  

1996 ◽  
Vol 159 (1-4) ◽  
pp. 555-565 ◽  
Author(s):  
A. Ishibashi
Keyword(s):  

2011 ◽  
Vol 399-401 ◽  
pp. 1034-1038
Author(s):  
Rong Rong Zhuang ◽  
Ping Cai ◽  
Jiang Li Huang

The junction temperature of GaN-based high-power green light emitting diodes is measured using the temperature coefficients of the diode forward voltage, from changes in temperature and changes in drive current to measure the LED junction temperature and the corresponding spectral, Respectively. Experiments show that, junction temperature due to environmental temperature increased, and the red shift of the spectral peak wavelength. When low temperature or less then the rated current range, the drive current increased in junction temperature rise due to the spectral peak wavelength blue shift . When the current is increased in the range of close to or greater than the rated current, leading to the junction temperature rise will cause spectral red shift . The peak wavelengths’ shift degree of 0.0579nm / k, 0.0751 nm / k and-0.1974nm / k, -0.0915 nm / k are calculated in both cases. The phenomenon is due to the LED junction temperature increases lead to band gap shrinkage, and the result of the role of spontaneous polarization and piezoelectric polarization in Ⅲ-nitride semiconductor materials.


Author(s):  
K. Kishino ◽  
K. Yamano ◽  
S. Ishizawa ◽  
K. Nagashima ◽  
R. Araki ◽  
...  
Keyword(s):  

2000 ◽  
Vol 221 (1-4) ◽  
pp. 652-656 ◽  
Author(s):  
Y Hosokawa ◽  
W Nabekura ◽  
T Hoshina ◽  
R Takeuchi ◽  
K Sakaue ◽  
...  

2006 ◽  
Vol 18 (4) ◽  
pp. 616-618 ◽  
Author(s):  
M.H. Hu ◽  
Hong Ky Nguyen ◽  
Kechang Song ◽  
Yabo Li ◽  
N.J. Visovsky ◽  
...  

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