P-type nitrogen- and phosphorus-doped ZnO thin films grown by pulsed laser deposition on sapphire substrates

Author(s):  
J.-P. Mosnier ◽  
S. Chakrabarti ◽  
B. Doggett ◽  
E. McGlynn ◽  
M. O. Henry ◽  
...  
2004 ◽  
Vol 201 (12) ◽  
pp. 2837-2840 ◽  
Author(s):  
Veeramuthu Vaithianathan ◽  
Byung-Teak Lee ◽  
Sang Sub Kim

2007 ◽  
Vol 42 (1-6) ◽  
pp. 74-78 ◽  
Author(s):  
B. Doggett ◽  
S. Chakrabarti ◽  
R. O’Haire ◽  
A. Meaney ◽  
E. McGlynn ◽  
...  

2011 ◽  
Vol 257 (11) ◽  
pp. 5121-5124 ◽  
Author(s):  
Ziwen Zhao ◽  
Lizhong Hu ◽  
Heqiu Zhang ◽  
Jingchang Sun ◽  
Jiming Bian ◽  
...  

2010 ◽  
Vol 27 (1) ◽  
pp. 017301 ◽  
Author(s):  
Zhao Zi-Wen ◽  
Hu Li-Zhong ◽  
Zhang He-Qiu ◽  
Sun Jing-Chang ◽  
Bian Ji-Ming ◽  
...  

2007 ◽  
Vol 42 (1-6) ◽  
pp. 21-25 ◽  
Author(s):  
S. Chakrabarti ◽  
B. Doggett ◽  
R. O’Haire ◽  
E. McGlynn ◽  
M.O. Henry ◽  
...  

2005 ◽  
Vol 16 (7) ◽  
pp. 421-427 ◽  
Author(s):  
J. R. Duclère ◽  
R. O’Haire ◽  
A. Meaney ◽  
K. Johnston ◽  
I. Reid ◽  
...  

2010 ◽  
Vol 24 (28) ◽  
pp. 2785-2791
Author(s):  
J. ELANCHEZHIYAN ◽  
D. W. LEE ◽  
W. J. LEE ◽  
B. C. SHIN

p-type conduction in ZnO thin films has been realized by doping with GaN . Undoped and GaN -doped ZnO thin films were prepared by the pulsed laser deposition technique. All the grown films have been characterized by X-ray diffraction (XRD), atomic force microscopy (AFM) and Hall effect measurements in order to study their structural, morphological and electrical properties, respectively. The presence of dopants in the films has been confirmed by energy dispersive X-ray spectroscopy (EDS). XRD results reveal that the wurtzite structure deviates for the films with higher concentrations of GaN . Hall measurements show that the 5 and 10 at.% GaN -doped ZnO films have p-type conduction.


2021 ◽  
Vol 120 ◽  
pp. 111461
Author(s):  
Sukittaya Jessadaluk ◽  
Narathon Khemasiri ◽  
Prapakorn Rattanawarinchai ◽  
Navaphun Kayunkid ◽  
Sakon Rahong ◽  
...  

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