Optical full-field measurement of strain at a microscopic scale with the grid method

2006 ◽  
Author(s):  
Raphaël Moulart ◽  
René Rotinat ◽  
Fabrice Pierron ◽  
Gilles Lerondel ◽  
Pascal Royer
Keyword(s):  
Field Measurement ◽  
Grid Method ◽  
Full Field ◽  
Microscopic Scale ◽  
Full Field Measurement

Full-field measurement of micro strain of printed circuit board assembly using digital image correlation

2017 ◽  
Vol 46 (11) ◽  
pp. 1103004
Author(s):  
杨靖 Yang Jing ◽  
吴思进 Wu Sijin ◽  
郑伟巍 Zheng Weiwei ◽  
李伟仙 Li Weixian ◽  
杨连祥 Yang Lianxiang
Keyword(s):  
Digital Image Correlation ◽  
Field Measurement ◽  
Printed Circuit Board ◽  
Image Correlation ◽  
Circuit Board ◽  
Printed Circuit Board Assembly ◽  
Full Field ◽  
Printed Circuit ◽  
Full Field Measurement ◽  
Circuit Board Assembly
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