The simulation study on point spread function and thick specimen imaging of optical microscope imaging system

2006 ◽  
Author(s):  
Jinli Yao ◽  
Xia Wang ◽  
Weiqi Jin ◽  
Hua Chen ◽  
Binghua Su
2007 ◽  
Vol 46 (3) ◽  
pp. 273-282 ◽  
Author(s):  
Masaki Ohkubo ◽  
Shinichi Wada ◽  
Masayuki Kunii ◽  
Toru Matsumoto ◽  
Kanae Nishizawa

2013 ◽  
Vol 33 (4) ◽  
pp. 0411002
Author(s):  
周红仙 Zhou Hongxian ◽  
周有平 Zhou Youping ◽  
王毅 Wang Yi

2020 ◽  
Vol 40 (14) ◽  
pp. 1405003
Author(s):  
卢泉 Lu Quan ◽  
张泽昊 Zhang Zehao ◽  
张卫平 Zhang Weiping ◽  
刘诣荣 Liu Yirong

2015 ◽  
Vol 44 (3) ◽  
pp. 311004
Author(s):  
马庆力 MA Qing-li ◽  
唐世彪 TANG Shi-biao ◽  
吴彦华 WU Yan-hua

2020 ◽  
Vol 22 (2) ◽  
pp. 025703
Author(s):  
Bin Feng ◽  
Zelin Shi ◽  
Haizheng Liu ◽  
Yaohong Zhao ◽  
Jianlei Zhang

2010 ◽  
Vol 18 (4) ◽  
Author(s):  
R. Kotyński

AbstractMetal-dielectric layered stacks for imaging with sub-wavelength resolution are regarded as linear isoplanatic systems — a concept popular in Fourier optics and in scalar diffraction theory. In this context, a layered flat lens is a one-dimensional spatial filter characterised by the point spread function. However, depending on the model of the source, the definition of the point spread function for multilayers with sub-wavelength resolution may be formulated in several ways. Here, a distinction is made between a soft source and hard electric or magnetic sources. Each of these definitions leads to a different meaning of perfect imaging. It is shown that some simple interpretations of the PSF, such as the relation of its width to the resolution of the imaging system are ambiguous for the multilayers with sub-wavelenth resolution. These differences must be observed in point spread function engineering of layered systems with sub-wavelength sized PSF.


2016 ◽  
Author(s):  
Hongjun Mao ◽  
Yonghui Liang ◽  
Zongfu Huang ◽  
Jin Liu ◽  
Pengzhi Jiang

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