Stable operation of a 532 nm microchip laser with a temperature controller

2006 ◽  
Author(s):  
Tetsuo Harimoto ◽  
Joji Watanabe
Keyword(s):  
Microchip Laser ◽  
Stable Operation ◽  
Temperature Controller ◽  
532 Nm

1kHz, Er3+/Yb3+: glass passively Q-switched microchip laser with long time stable operation

2021 ◽  
Author(s):  
Huaimiao Sun ◽  
Zejun Li ◽  
Zhanda Zhu ◽  
Yonglin Hui ◽  
Hong Lei ◽  
...  
Keyword(s):  
Microchip Laser ◽  
Stable Operation ◽  
Long Time

Compact 532 nm microchip laser array utilizing optical contact Nd:YVO4/PPMgOLN

2017 ◽  
Vol 46 (6) ◽  
pp. 605003
Author(s):  
刘玉良 Liu Yuliang ◽  
梁万国 Liang Wanguo ◽  
周 煌 Zhou Huang ◽  
陈立元 Chen Liyuan ◽  
鲁国志 Lu Guozhi
Keyword(s):  
Microchip Laser ◽  
Laser Array ◽  
Optical Contact ◽  
532 Nm

scholarly journals > 6 MW peak power at 532 nm from passively Q-switched Nd:YAG/Cr^4+:YAG microchip laser

2011 ◽  
Vol 19 (20) ◽  
pp. 19135 ◽  
Author(s):  
Rakesh Bhandari ◽  
Takunori Taira
Keyword(s):  
Peak Power ◽  
Microchip Laser ◽  
532 Nm

scholarly journals Compact single-longitudinal mode microchip laser operating at 532 nm

2014 ◽  
Vol 6 (1) ◽  
Author(s):  
Jaroslaw Sotor ◽  
Grzegorz Dudzik ◽  
Krzysztof Abramski
Keyword(s):  
Longitudinal Mode ◽  
Microchip Laser ◽  
Single Longitudinal Mode ◽  
532 Nm

Prospects of development of the reference base of the Russian Federation in the field of length measurements

2020 ◽  
pp. 3-5
Author(s):  
Y. G. Zakharenko ◽  
N. A. Kononova ◽  
V. L. Fedorin ◽  
Z. V. Fomkina ◽  
K. V. Chekirda
Keyword(s):  
High Precision ◽  
Russian Federation ◽  
Reference Base ◽  
Length Measurements ◽  
Laser Sources ◽  
The Russian Federation ◽  
Unit Of Length ◽  
Further Development ◽  
532 Nm

The results of the work to create a complex of high-precision hardware for the unit of length reproduction and transferring carried out at “D. I. Mendeleyev Institute for Metrology (VNIIM)” are represented. This complex will serve as the basis for the further development of the reference base of the Russian Federation in the field of length measurements and will allow reproduction of the unit of length at two wavelengths of 633 nm and 532 nm, as well as measurements of the wavelength of laser sources in vacuum in the range from 500 to 1050 nm.

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