Prototyping micro-optical components with integrated out-of-plane coupling structures using deep lithography with protons

2006 ◽  
Author(s):  
Jürgen Van Erps ◽  
Lawrence Bogaert ◽  
Bart Volckaerts ◽  
Christof Debaes ◽  
Hugo Thienpont
Keyword(s):  
Optical Components ◽  
Out Of Plane

A Micro Helico-Kinematic Platform via Spherical Crank Sliders

2004 ◽  
Author(s):  
Craig P. Lusk ◽  
Larry L. Howell
Keyword(s):  
Virtual Work ◽  
Full Range ◽  
Vertical Motion ◽  
Helical Motion ◽  
Plane Rotation ◽  
Stick Slip ◽  
Optical Components ◽  
Analysis Techniques ◽  
Out Of Plane ◽  
Design Freedom

A novel surface micromachined mechanism, the Micro Helico-Kinematic Platform (MHKP), is presented. The MHKP achieves a combination of vertical out-of-plane translation and in-plane rotation (helical motion) of a platform with an in-plane rotational input. The motion achieved requires specialized analysis techniques in spherical kinematics and introduces the micro spherical crank-slider. Spherical kinematic concepts are reviewed to aid in describing the motion and conveying the scope of the device’s design freedom. The force and displacement relations for the mechanism are derived using virtual work techniques. A surface micromachined prototype was fabricated and tested. Testing indicates that the sliding interface between the spherical crank sliders and the platform results in some stick-slip friction and that the mechanism is able to achieve its full range of motion. The vertical motion of the platform can be advantageous in micro manipulation applications such as the positioning of micro-optical components.

scholarly journals Mirror contamination in space I: approach

2014 ◽  
Vol 7 (2) ◽  
pp. 1213-1246 ◽  
Author(s):  
J. M. Krijger ◽  
R. Snel ◽  
G. van Harten ◽  
J. H. H. Rietjens ◽  
I. Aben
Keyword(s):  
Mueller Matrix ◽  
Matrix Formalism ◽  
Comprehensive Model ◽  
Optical Behaviour ◽  
Optical Components ◽  
Operational Lifetime ◽  
Matrix Calculus ◽  
Out Of Plane ◽  
Multiple Scan ◽  
Absorbing Layer

Abstract. We present a comprehensive model that can be employed to describe and correct for degradation of (scan) mirrors and diffusers in satellite instruments that suffer from changing optical UV-VIS properties during their operational lifetime. As trend studies become more important, so does the importance to understand and correct for this degradation. This is the case not only with respect to the transmission of the optical components, but also with respect to wavelength, polarisation or scan-angle-effects. Our hypothesis is that mirrors in-flight suffer from the deposition of a thin absorbing layer of contaminant, which slowly builds up over time. We describe this with the Mueller matrix formalism and Fresnel equations for thin multi-layer contamination films. Special care is taken to avoid the confusion often present in earlier publications concerning Mueller matrix calculus with out of plane reflections. The method can be applied to any UV-VIS satellite instrument, and in any orbit, both low and geostationary. We illustrate and verify our approach on the optical behaviour of the multiple scan mirrors of SCIAMACHY (on board of ENVISAT).

scholarly journals Mirror contamination in space I: mirror modelling

2014 ◽  
Vol 7 (10) ◽  
pp. 3387-3398 ◽  
Author(s):  
J. M. Krijger ◽  
R. Snel ◽  
G. van Harten ◽  
J. H. H. Rietjens ◽  
I. Aben
Keyword(s):  
Mueller Matrix ◽  
Matrix Formalism ◽  
Comprehensive Model ◽  
Optical Behaviour ◽  
Optical Components ◽  
Operational Lifetime ◽  
Matrix Calculus ◽  
Out Of Plane ◽  
Multiple Scan ◽  
Absorbing Layer

Abstract. We present a comprehensive model that can be employed to describe and correct for degradation of (scan) mirrors and diffusers in satellite instruments that suffer from changing optical Ultraviolet to visible (UV–VIS) properties during their operational lifetime. As trend studies become more important, so does the importance of understanding and correcting for this degradation. This is the case not only with respect to the transmission of the optical components, but also with respect to wavelength, polarisation, or scan-angle effects. Our hypothesis is that mirrors in flight suffer from the deposition of a thin absorbing layer of contaminant, which slowly builds up over time. We describe this with the Mueller matrix formalism and Fresnel equations for thin multi-layer contamination films. Special care is taken to avoid the confusion often present in earlier publications concerning the Mueller matrix calculus with out-of-plane reflections. The method can be applied to any UV–VIS satellite instrument. We illustrate and verify our approach to the optical behaviour of the multiple scan mirrors of SCIAMACHY (onboard ENVISAT).

Preparation of Thin Cadmium Telluride Samples for Electron Microscope Studies

1974 ◽  
Vol 32 ◽  
pp. 548-549
Author(s):  
T. J. Magee ◽  
J. Peng ◽  
J. Bean
Keyword(s):  
Electron Microscope ◽  
Sulfuric Acid ◽  
Solid State ◽  
Sample Preparation ◽  
Cadmium Telluride ◽  
Potassium Dichromate ◽  
Optical Components ◽  
The Past ◽  
Solid State Devices

Cadmium telluride has become increasingly important in a number of technological applications, particularly in the area of laser-optical components and solid state devices, Microstructural characterizations of the material have in the past been somewhat limited because of the lack of suitable sample preparation and thinning techniques. Utilizing a modified jet thinning apparatus and a potassium dichromate-sulfuric acid thinning solution, a procedure has now been developed for obtaining thin contamination-free samples for TEM examination.

Grain separation enhanced magnetic coercivity in Pt/Co multilayers.

1993 ◽  
Vol 51 ◽  
pp. 1038-1039 ◽  
Author(s):  
G.A. Bertero ◽  
R. Sinclair
Keyword(s):  
Remanent Magnetization ◽  
Strong Influence ◽  
Uniaxial Anisotropy ◽  
Magnetic Coupling ◽  
Recording Media ◽  
Magnetic Media ◽  
Signal To Noise ◽  
Out Of Plane ◽  
Longitudinal Recording ◽  
The Relationship

Pt/Co multilayers displaying perpendicular (out-of-plane) magnetic anisotropy and 100% perpendicular remanent magnetization are strong candidates as magnetic media for the next generation of magneto-optic recording devices. The magnetic coercivity, Hc, and uniaxial anisotropy energy, Ku, are two important materials parameters, among others, in the quest to achieving higher recording densities with acceptable signal to noise ratios (SNR). The relationship between Ku and Hc in these films is not a simple one since features such as grain boundaries, for example, can have a strong influence on Hc but affect Ku only in a secondary manner. In this regard grain boundary separation provides a way to minimize the grain-to-grain magnetic coupling which is known to result in larger coercivities and improved SNR as has been discussed extensively in the literature for conventional longitudinal recording media.We present here results from the deposition of two Pt/Co/Tb multilayers (A and B) which show significant differences in their coercive fields.

Anisotropy of Nanoindentation – a tool for the determination of nanocrystal orientation ?

2003 ◽  
Vol 779 ◽  
Author(s):  
David Christopher ◽  
Steven Kenny ◽  
Roger Smith ◽  
Asta Richter ◽  
Bodo Wolf ◽  
...  
Keyword(s):  
Crystal Surface ◽  
Scanning Force Microscopy ◽  
Depth Range ◽  
Dislocation Loops ◽  
Force Microscopy ◽  
Pile Up ◽  
Out Of Plane ◽  
Scanning Force ◽  
Dynamics Simulations

AbstractThe pile up patterns arising in nanoindentation are shown to be indicative of the sample crystal symmetry. To explain and interpret these patterns, complementary molecular dynamics simulations and experiments have been performed to determine the atomistic mechanisms of the nanoindentation process in single crystal Fe{110}. The simulations show that dislocation loops start from the tip and end on the crystal surface propagating outwards along the four in-plane <111> directions. These loops carry material away from the indenter and form bumps on the surface along these directions separated from the piled-up material around the indenter hole. Atoms also move in the two out-of-plane <111> directions causing propagation of subsurface defects and pile-up around the hole. This finding is confirmed by scanning force microscopy mapping of the imprint, the piling-up pattern proving a suitable indicator of the surface crystallography. Experimental force-depth curves over the depth range of a few nanometers do not appear smooth and show distinct pop-ins. On the sub-nanometer scale these pop-ins are also visible in the simulation curves and occur as a result of the initiation of the dislocation loops from the tip.

Self-Assembly Optical Components

2003 ◽  
Vol 771 ◽  
Author(s):  
Pavel I. Lazarev ◽  
Michael V. Paukshto ◽  
Elena N. Sidorenko
Keyword(s):  
Optical Properties ◽  
Self Assembly ◽  
Crystalline State ◽  
Liquid Crystalline ◽  
Film Deposition ◽  
X Ray Diffraction ◽  
Optical Components ◽  
Crystal Film ◽  
Solid Film ◽  
Thin Crystal

AbstractWe report a new method of Thin Crystal Film deposition. In the present paper we describe the method of crystallization, structure, and optical properties of Bisbenzimidazo[2,1-a:1',2',b']anthra[2,1,9-def:6,5,10-d'e'f']-diisoquinoline-6,9-dion (mixture with cis-isomer) (abbreviated DBI PTCA) sulfonation product. The Thin Crystal Film has a thickness of 200-1000 nm, with anisotropic optical properties such as refraction and absorption indices. X-ray diffraction data evidences a lyotropic liquid crystalline state in liquid phase and crystalline state in solid film. Anisotropic optical properties of the film make it useful in optical devices, e.g. liquid crystal displays.

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