Development of DMD reflection-type CCD camera for phase analysis and shape measurement

2005 ◽  
Author(s):  
Shien Ri ◽  
Yasuhiro Matsunaga ◽  
Motoharu Fujigaki ◽  
Toru Matui ◽  
Yoshiharu Morimoto
Keyword(s):  
Phase Analysis ◽  
Ccd Camera ◽  
Shape Measurement

Development of DMD Reflection-Type CCD Camera for Phase Analysis and Shape Measurement

2006 ◽  
Vol 18 (6) ◽  
pp. 728-737 ◽  
Author(s):  
Shien Ri ◽  
◽  
Yasuhiro Matsunaga ◽  
Motoharu Fujigaki ◽  
Toru Matui ◽  
...  
Keyword(s):  
Phase Analysis ◽  
High Speed ◽  
Ccd Camera ◽  
High Accuracy ◽  
Phase Shifting ◽  
Shape Measurement ◽  
Digital Micromirror Device ◽  
Imaging Detector ◽  
Convention Center ◽  
Phase Shifting Method

Phase-shifting method effectively attains high resolution and high accuracy in analyzing phase information on a projected grating. It is difficult to apply dynamically, however, because it usually requires several images. We developed a camera based on digital micromirror device (DMD) technology for high-speed phase analysis and shape measurement, called a DMD reflection-type CCD camera or DMD camera. Implementing DMD technology enables accurate control of intensity reaching the imaging detector of a camera. Moiré is used to adjust pixel-to-pixel correspondence highly accuracy. We introduce a controllable high-speed DMD operation board to control DMD mirrors at high-speed, so each DMD mirror operates as a controllable high-speed shutter for the corresponding CCD pixel. In experiments with an application, we conducted DMD integrated phase-shifting method using correlation to analyze phase distributions of projected gratings from images recorded by the DMD camera. We then discuss principles and experimental results under dynamic conditions. This paper is a revised version of one presented at the SPIE International Symposium on Optomechatronic Technologies (ISOT 2005), December 4-7, 2005 at the Sapporo Convention Center, Japan. That paper appears in SPIE Proceedings Vol.6049, 60490I.

scholarly journals High-Speed Measurement of Shape and Vibration: Whole-Field Systems for Motion Capture and Vibration Modal Analysis by OPPA Method

Sensors ◽  
2020 ◽  
Vol 20 (15) ◽  
pp. 4263
Author(s):  
Yoshiharu Morimoto
Keyword(s):  
Modal Analysis ◽  
Phase Analysis ◽  
Motion Capture ◽  
High Speed ◽  
Phase Distribution ◽  
Conveyor Belt ◽  
Human Motion ◽  
Shape Measurement ◽  
The One ◽  
Vibration Modal

In shape measurement systems using a grating projection method, the phase analysis of a projected grating provides accurate results. The most popular phase analysis method is the phase shifting method, which requires several images for one shape analysis. Therefore, the object must not move during the measurement. The authors previously proposed a new accurate and high-speed shape measurement method, i.e., the one-pitch phase analysis (OPPA) method, which can determine the phase at every point of a single image of an object with a grating projected onto it. In the OPPA optical system, regardless of the distance of the object from the camera, the one-pitch length (number of pixels) on the imaging surface of the camera sensor is always constant. Therefore, brightness data for one pitch at any point of the image can be easily analyzed to determine phase distribution, or shape. This technology will apply to the measurement of objects in motion, including automobiles, robot arms, products on a conveyor belt, and vibrating objects. This paper describes the principle of the OPPA method and example applications for real-time human motion capture and modal analysis of free vibration of a flat cantilever plate after hammering. The results show the usefulness of the OPPA method.

Improvement of accuracy of shape measurement using DMD reflection-type CCD camera

2005 ◽  
Author(s):  
Motoharu Fujigaki ◽  
Yoshiharu Morimoto ◽  
Shien Ri
Keyword(s):  
Ccd Camera ◽  
Shape Measurement

Brief summary of Kleť photographic search programme for minor planets

1999 ◽  
Vol 173 ◽  
pp. 189-192
Author(s):  
J. Tichá ◽  
M. Tichý ◽  
Z. Moravec
Keyword(s):  
Ccd Camera ◽  
Minor Planet ◽  
Minor Planets ◽  
Main Belt

AbstractA long-term photographic search programme for minor planets was begun at the Kleť Observatory at the end of seventies using a 0.63-m Maksutov telescope, but with insufficient respect for long-arc follow-up astrometry. More than two thousand provisional designations were given to new Kleť discoveries. Since 1993 targeted follow-up astrometry of Kleť candidates has been performed with a 0.57-m reflector equipped with a CCD camera, and reliable orbits for many previous Kleť discoveries have been determined. The photographic programme results in more than 350 numbered minor planets credited to Kleť, one of the world's most prolific discovery sites. Nearly 50 per cent of them were numbered as a consequence of CCD follow-up observations since 1994.This brief summary describes the results of this Kleť photographic minor planet survey between 1977 and 1996. The majority of the Kleť photographic discoveries are main belt asteroids, but two Amor type asteroids and one Trojan have been found.

Zero-loss omega-filtered REM and RHEED on the new Zeiss 912

1991 ◽  
Vol 49 ◽  
pp. 616-617
Author(s):  
J.C.H. Spence ◽  
J. Mayer
Keyword(s):  
Electron Microscopy ◽  
Materials Science ◽  
Surface States ◽  
Ccd Camera ◽  
Dark Field ◽  
Ion Pump ◽  
Magnetic Imaging ◽  
Reflection Electron Microscopy ◽  
Diffraction Patterns ◽  
Large Background

The Zeiss 912 is a new fully digital, side-entry, 120 Kv TEM/STEM instrument for materials science, fitted with an omega magnetic imaging energy filter. Pumping is by turbopump and ion pump. The magnetic imaging filter allows energy-filtered images or diffraction patterns to be recorded without scanning using efficient parallel (area) detection. The energy loss intensity distribution may also be displayed on the screen, and recorded by scanning it over the PMT supplied. If a CCD camera is fitted and suitable new software developed, “parallel ELS” recording results. For large fields of view, filtered images can be recorded much more efficiently than by Scanning Reflection Electron Microscopy, and the large background of inelastic scattering removed. We have therefore evaluated the 912 for REM and RHEED applications. Causes of streaking and resonance in RHEED patterns are being studied, and a more quantitative analysis of CBRED patterns may be possible. Dark field band-gap REM imaging of surface states may also be possible.

Automated electron tomography: from data collection to image processing

1995 ◽  
Vol 53 ◽  
pp. 26-27
Author(s):  
Weiping Liu ◽  
Jennifer Fung ◽  
W.J. de Ruijter ◽  
Hans Chen ◽  
John W. Sedat ◽  
...  
Keyword(s):  
Image Processing ◽  
Data Collection ◽  
Structural Information ◽  
Imaging Technique ◽  
Electron Tomography ◽  
Ccd Camera ◽  
Automated Data Collection ◽  
Full Control ◽  
Transmission Electron ◽  
Amorphous Structures

Electron tomography is a technique where many projections of an object are collected from the transmission electron microscope (TEM), and are then used to reconstruct the object in its entirety, allowing internal structure to be viewed. As vital as is the 3-D structural information and with no other 3-D imaging technique to compete in its resolution range, electron tomography of amorphous structures has been exercised only sporadically over the last ten years. Its general lack of popularity can be attributed to the tediousness of the entire process starting from the data collection, image processing for reconstruction, and extending to the 3-D image analysis. We have been investing effort to automate all aspects of electron tomography. Our systems of data collection and tomographic image processing will be briefly described.To date, we have developed a second generation automated data collection system based on an SGI workstation (Fig. 1) (The previous version used a micro VAX). The computer takes full control of the microscope operations with its graphical menu driven environment. This is made possible by the direct digital recording of images using the CCD camera.

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