Characterization of plumes produced during ultrashort laser ablation of metals and semiconductors

2005 ◽  
Author(s):  
Salvatore Amoruso ◽  
Marco Vitiello
Keyword(s):  
Laser Ablation ◽  
Ultrashort Laser

Characterization of aluminum, brass and steel nanoparticles after laser ablation

2009 ◽  
Author(s):  
Nancy Van Suetendael ◽  
Kristie Powell ◽  
Susan Earles ◽  
Mary Helen McCay ◽  
Ivica Kostanic
Keyword(s):  
Laser Ablation

Detection and Characterization of an Electrical Failure Induced during Laser Ablation of Packages

2008 ◽  
Author(s):  
P. Schwindenhammer ◽  
H. Murray ◽  
P. Descamps ◽  
P. Poirier
Keyword(s):  
Laser Ablation ◽  
Integrated Circuits ◽  
Failure Analysis ◽  
Ablation Process ◽  
Thermally Induced ◽  
Electrical Failure ◽  
Electrical Phenomenon ◽  
Semiconductor Packages ◽  
Complex Semiconductor

Abstract Decapsulation of complex semiconductor packages for failure analysis is enhanced by laser ablation. If lasers are potentially dangerous for Integrated Circuits (IC) surface they also generate a thermal elevation of the package during the ablation process. During measurement of this temperature it was observed another and unexpected electrical phenomenon in the IC induced by laser. It is demonstrated that this new phenomenon is not thermally induced and occurs under certain ablation conditions.

Ultrashort laser ablation of bulk copper targets: Dynamics and size distribution of the generated nanoparticles

2014 ◽  
Vol 115 (24) ◽  
pp. 243301 ◽  
Author(s):  
N. Tsakiris ◽  
K. K. Anoop ◽  
G. Ausanio ◽  
M. Gill-Comeau ◽  
R. Bruzzese ◽  
...  
Keyword(s):  
Laser Ablation ◽  
Size Distribution ◽  
Ultrashort Laser

Three dimensional characterization of laser ablation craters using high resolution X-ray computed tomography

2018 ◽  
Vol 139 ◽  
pp. 75-82 ◽  
Author(s):  
A.H. Galmed ◽  
A. du Plessis ◽  
S.G. le Roux ◽  
E. Hartnick ◽  
H. Von Bergmann ◽  
...  
Keyword(s):  
Computed Tomography ◽  
Laser Ablation ◽  
High Resolution ◽  
Three Dimensional ◽  
X Ray ◽  
X Ray Computed
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