Use of monochromatic phase data for improved profile measurement in spectrally resolved white light interferometry

Mapping Intimacies ◽

10.1117/12.614271 ◽

2005 ◽

Author(s):

S. K. Debnath ◽

D. K. Sharma ◽

M. P. Kothiyal

Keyword(s):

White Light ◽

Profile Measurement ◽

White Light Interferometry ◽

Phase Data ◽

Spectrally Resolved

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Group-Delay Dispersion Measurement of Laser Mirrors by Spectrally Resolved White-Light Interferometry

Springer Series in Chemical Physics - Ultrafast Phenomena IX ◽

10.1007/978-3-642-85176-6_47 ◽

1994 ◽

pp. 145-146

Author(s):

A. P. Kovács ◽

R. Szipöcs ◽

K. Osvay ◽

Z. Bor

Keyword(s):

White Light ◽

Group Delay ◽

Group Delay Dispersion ◽

White Light Interferometry ◽

Dispersion Measurement ◽

Spectrally Resolved

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Improved optical profiling using the spectral phase in spectrally resolved white-light interferometry

Applied Optics ◽

10.1364/ao.45.006965 ◽

2006 ◽

Vol 45 (27) ◽

pp. 6965 ◽

Cited By ~ 17

Author(s):

Sanjit Kumar Debnath ◽

Mahendra Prasad Kothiyal

Keyword(s):

White Light ◽

Spectral Phase ◽

White Light Interferometry ◽

Spectrally Resolved

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Measurement of optical constants of thin polymer films using spectrally resolved white light interferometry

Pramana ◽

10.1007/bf02847302 ◽

1996 ◽

Vol 47 (2) ◽

pp. 163-170 ◽

Cited By ~ 2

Author(s):

V Nirmal Kumar ◽

Y Chandrasekhar ◽

D Narayana Rao

Keyword(s):

Polymer Films ◽

White Light ◽

Optical Constants ◽

Thin Polymer Films ◽

White Light Interferometry ◽

Thin Polymer ◽

Spectrally Resolved

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Optical profiler based on spectrally resolved white light interferometry

Optical Engineering ◽

10.1117/1.1828468 ◽

2005 ◽

Vol 44 (1) ◽

pp. 013606 ◽

Cited By ~ 19

Author(s):

S. K. Debnath

Keyword(s):

White Light ◽

White Light Interferometry ◽

Spectrally Resolved

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Measurement of dispersive properties of optical materials and mirrors using spectrally resolved white-light interferometry

10.1117/12.306204 ◽

1998 ◽

Author(s):

Zsolt Bor ◽

Attila P. Kovacs ◽

Karoly Osvay ◽

Robert Szipocs

Keyword(s):

White Light ◽

Optical Materials ◽

White Light Interferometry ◽

Spectrally Resolved

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Minimization of spectral phase errors in spectrally resolved white light interferometry by the iterative least-squared phase-shifting method

Measurement Science and Technology ◽

10.1088/0957-0233/23/12/125203 ◽

2012 ◽

Vol 23 (12) ◽

pp. 125203 ◽

Cited By ~ 6

Author(s):

Joonho You ◽

Ki-Nam Joo

Keyword(s):

White Light ◽

Spectral Phase ◽

Phase Shifting ◽

White Light Interferometry ◽

Phase Errors ◽

Phase Shifting Method ◽

Spectrally Resolved

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Evaluation of group index in spectrally resolved white light interferometry

Optics & Laser Technology ◽

10.1016/j.optlastec.2020.106507 ◽

2021 ◽

Vol 133 ◽

pp. 106507

Author(s):

Yago Arosa ◽

Raúl de la Fuente

Keyword(s):

White Light ◽

Group Index ◽

White Light Interferometry ◽

Spectrally Resolved

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Visualization and measurement of a stationary thermal lens using spectrally resolved white light interferometry

Optics Communications ◽

10.1016/s0030-4018(97)00058-8 ◽

1997 ◽

Vol 138 (1-3) ◽

pp. 1-5 ◽

Cited By ~ 13

Author(s):

J. Calatroni ◽

A. Marcano ◽

R. Escalona ◽

P. Sandoz

Keyword(s):

White Light ◽

Thermal Lens ◽

White Light Interferometry ◽

Spectrally Resolved

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Spectrally resolved white-light interferometry for profilometry with polarization phase shifter

10.1117/12.369373 ◽

1999 ◽

Cited By ~ 1

Author(s):

S. Suja Helen ◽

Mahendra P. Kothiyal ◽

Rajpal S. Sirohi

Keyword(s):

White Light ◽

Phase Shifter ◽

White Light Interferometry ◽

Spectrally Resolved ◽

Polarization Phase

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Single-shot two-dimensional surface measurement based on spectrally resolved white-light interferometry

Applied Optics ◽

10.1364/ao.51.004971 ◽

2012 ◽

Vol 51 (21) ◽

pp. 4971 ◽

Cited By ~ 7

Author(s):

Pei Zhu ◽

Kaiwei Wang

Keyword(s):

White Light ◽

Surface Measurement ◽

Single Shot ◽

Two Dimensional ◽

White Light Interferometry ◽

Spectrally Resolved ◽

Dimensional Surface

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