A simple noise modeling based testing of CMOS analog integrated circuits

Mapping Intimacies ◽

10.1117/12.609253 ◽

2005 ◽

Author(s):

Siva Yellampalli ◽

Ashok Srivastava

Keyword(s):

Integrated Circuits ◽

Analog Integrated Circuits ◽

Cmos Analog Integrated Circuits ◽

Noise Modeling

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Coping with process variations in ultra-low power CMOS analog integrated circuits

Proceedings 2007 IEEE SoutheastCon ◽

10.1109/secon.2007.342853 ◽

2007 ◽

Cited By ~ 4

Author(s):

Z. Wang ◽

H. Savci ◽

J.D. Griggs ◽

N. Dogan ◽

E. Arvas

Keyword(s):

Integrated Circuits ◽

Low Power ◽

Analog Integrated Circuits ◽

Process Variations ◽

Cmos Analog Integrated Circuits ◽

Ultra Low Power ◽

Low Power Cmos

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AMGIE-A synthesis environment for CMOS analog integrated circuits

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems ◽

10.1109/43.945301 ◽

2001 ◽

Vol 20 (9) ◽

pp. 1037-1058 ◽

Cited By ~ 77

Author(s):

G. Van der Plas ◽

G. Debyser ◽

F. Leyn ◽

K. Lampaert ◽

J. Vandenbussche ◽

...

Keyword(s):

Integrated Circuits ◽

Analog Integrated Circuits ◽

Cmos Analog Integrated Circuits

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CMOS Analog Integrated Circuits

10.1201/9780429455995 ◽

2019 ◽

Author(s):

Tertulien Ndjountche

Keyword(s):

Integrated Circuits ◽

Analog Integrated Circuits ◽

Cmos Analog Integrated Circuits

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Nonisothermal Effects in SOI CMOS Analog Integrated Circuits Based on Electrothermal Simulation

2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings ◽

10.1109/icsict.2006.306106 ◽

2006 ◽

Author(s):

Ming-C. Cheng ◽

Feixia Yu

Keyword(s):

Integrated Circuits ◽

Analog Integrated Circuits ◽

Cmos Analog Integrated Circuits ◽

Electrothermal Simulation ◽

Soi Cmos

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Design for testability in nano-CMOS analog integrated circuits using a new design analog checker

2011 International SoC Design Conference ◽

10.1109/isocc.2011.6138774 ◽

2011 ◽

Cited By ~ 1

Author(s):

Mouna Karmani ◽

Ka Lok Man ◽

Chiraz Khedhiri ◽

Belgacem Hamdi

Keyword(s):

Integrated Circuits ◽

Analog Integrated Circuits ◽

Design For Testability ◽

Cmos Analog Integrated Circuits

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Improving symbolic analysis in CMOS analog integrated circuits

2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512) ◽

10.1109/iscas.2004.1329495 ◽

2004 ◽

Cited By ~ 2

Author(s):

J. Aguila-Meza ◽

L. Torres-Papaqui ◽

E. Tielo-Cuautle

Keyword(s):

Integrated Circuits ◽

Analog Integrated Circuits ◽

Symbolic Analysis ◽

Cmos Analog Integrated Circuits

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A fixed transconductance bias technique for CMOS analog integrated circuits

2004 IEEE International Symposium on Circuits and Systems (IEEE Cat. No.04CH37512) ◽

10.1109/iscas.2004.1328281 ◽

2004 ◽

Cited By ~ 3

Author(s):

Shanthi Pavan

Keyword(s):

Integrated Circuits ◽

Analog Integrated Circuits ◽

Cmos Analog Integrated Circuits

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A combined noise analysis and power supply current based testing of CMOS analog integrated circuits

10.1117/12.609258 ◽

2005 ◽

Cited By ~ 3

Author(s):

Ashok Srivastava ◽

Vani K. Pulendra ◽

Siva Yellampalli

Keyword(s):

Integrated Circuits ◽

Power Supply ◽

Noise Analysis ◽

Analog Integrated Circuits ◽

Cmos Analog Integrated Circuits ◽

Supply Current ◽

Current Based Testing

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Automatic biasing and sizing of CMOS analog integrated circuits

48th Midwest Symposium on Circuits and Systems, 2005. ◽

10.1109/mwscas.2005.1594251 ◽

2005 ◽

Cited By ~ 8

Author(s):

D. Torres-Munoz ◽

E. Tielo-Cuautle

Keyword(s):

Integrated Circuits ◽

Analog Integrated Circuits ◽

Cmos Analog Integrated Circuits

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MOSFET thermal noise modeling for analog integrated circuits

IEEE Journal of Solid-State Circuits ◽

10.1109/4.303722 ◽

1994 ◽

Vol 29 (7) ◽

pp. 833-835 ◽

Cited By ~ 92

Author(s):

Bing Wang ◽

J.R. Hellums ◽

C.G. Sodini

Keyword(s):

Integrated Circuits ◽

Thermal Noise ◽

Analog Integrated Circuits ◽

Noise Modeling

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