A monolithically integrated HgCdTe SWIR photodetector and tunable MEMS-based optical filter

2005 ◽  
Author(s):  
J. Antoszewski ◽  
K. J. Winchester ◽  
A. J. Keating ◽  
T. Nguyen ◽  
K. K. M. B. D. Silva ◽  
...  
Keyword(s):  
Optical Filter ◽  
Monolithically Integrated

Monolithically integrated tunable optical filter, amplifier and detector for HDWDM applications

1996 ◽  
Vol 32 (6) ◽  
pp. 586
Author(s):  
A.A.M. Staring ◽  
R. van Roijen ◽  
J.J.M. Binsma ◽  
E.J. Jansen ◽  
M.J.H. Sander-Jochem ◽  
...  
Keyword(s):  
Optical Filter ◽  
Monolithically Integrated ◽  
Tunable Optical Filter

scholarly journals InP monolithically integrated wavelength selector based on periodic optical filter and optical switch chain

2011 ◽  
Vol 19 (26) ◽  
pp. B531 ◽  
Author(s):  
Nicola Calabretta ◽  
Ripalta Stabile ◽  
Aaron Albores-Mejia ◽  
Kevin A. Williams ◽  
Harm J. S. Dorren
Keyword(s):  
Optical Switch ◽  
Optical Filter ◽  
Monolithically Integrated

Near-UV background as a bridge between visible and infrared communication

2014 ◽  
Vol 1666 ◽  
Author(s):  
M. Vieira ◽  
M. A. Vieira ◽  
V. Silva ◽  
I. Rodrigues ◽  
P. Louro
Keyword(s):  
Optical Filter ◽  
Optical Gain ◽  
Optical Switches ◽  
Background Intensity ◽  
Infrared Communication ◽  
Monolithically Integrated ◽  
Near Ultraviolet ◽  
Visible Part ◽  
Integrated Optical ◽  
The Relationship

ABSTRACTIn this paper we present a monolithically integrated wavelength selector based on a multilayer pi’n/pin a-SiC:H integrated optical filter that requires appropriate near-ultraviolet steady states optical switches to select the desired wavelengths in the VIS-NIR ranges.Results show that the background intensity works as a selector in the infrared/visible regions, shifting the sensor sensitivity. Low intensities select the NIR range while high intensities select the visible part accordingly to its wavelength. Here, the optical gain is very high in the red range, decreases in the green range, and stays near one in the blue region decreasing strongly in the near-UV range. The transfer characteristics effects due to changes in steady state light intensity and wavelength backgrounds are presented. The relationship between the optical inputs and the output signal is established when a multiplexed signal is analyzed.

Performance and Reliability of a MEMS-based tunable optical filter operating in the 1565 nm-1525 nm wavelength range

2002 ◽  
Vol 722 ◽  
Author(s):  
T. S. Sriram ◽  
B. Strauss ◽  
S. Pappas ◽  
A. Baliga ◽  
A. Jean ◽  
...  
Keyword(s):  
Silicon Nitride ◽  
Line Width ◽  
Insertion Loss ◽  
Optical Filter ◽  
Single Mode ◽  
Single Mode Fiber ◽  
Reliability Testing ◽  
Silicon Nitride Membrane ◽  
Tunable Optical Filter ◽  
Extensive Performance

AbstractThis paper describes the results of extensive performance and reliability characterization of a silicon-based surface micro-machined tunable optical filter. The device comprises a high-finesse Fabry-Perot etalon with one flat and one curved dielectric mirror. The curved mirror is mounted on an electrostatically actuated silicon nitride membrane tethered to the substrate using silicon nitride posts. A voltage applied to the membrane allows the device to be tuned by adjusting the length of the cavity. The device is coupled optically to an input and an output single mode fiber inside a hermetic package. Extensive performance characterization (over operating temperature range) was performed on the packaged device. Parameters characterized included tuning characteristics, insertion loss, filter line-width and side mode suppression ratio. Reliability testing was performed by subjecting the MEMS structure to a very large number of actuations at an elevated temperature both inside the package and on a test board. The MEMS structure was found to be extremely robust, running trillions of actuations without failures. Package level reliability testing conforming to Telcordia standards indicated that key device parameters including insertion loss, filter line-width and tuning characteristics did not change measurably over the duration of the test.

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