Waveguide pattern formation in the organic nonlinear optical crystal by electron beam irradiation

2005 ◽  
Author(s):  
Kyoji Komatsu ◽  
Toru Abe ◽  
Okihiro Sugihara ◽  
Toshikuni Kaino
Keyword(s):  
Electron Beam ◽  
Pattern Formation ◽  
Nonlinear Optical ◽  
Electron Beam Irradiation ◽  
Beam Irradiation ◽  
Nonlinear Optical Crystal ◽  
Optical Crystal

Electron-beam irradiation-induced nonlinearity in silicate glass films and fabrication of nonlinear optical gratings

1999 ◽  
Vol 86 (5) ◽  
pp. 2393-2396 ◽  
Author(s):  
Makoto Nakanishi ◽  
Okihiro Sugihara ◽  
Naomichi Okamoto ◽  
Hisashi Fujimura ◽  
Chikara Egami
Keyword(s):  
Electron Beam ◽  
Silicate Glass ◽  
Nonlinear Optical ◽  
Electron Beam Irradiation ◽  
Beam Irradiation ◽  
Optical Gratings ◽  
Glass Films

Fabrication technique of a nonlinear optical structure using optical polymeric films by direct electron-beam irradiation

1998 ◽  
Vol 37 (7) ◽  
pp. 1213 ◽  
Author(s):  
Hideki Nakayama ◽  
Hisashi Fujimura ◽  
Chikara Egami ◽  
Okihiro Sugihara ◽  
Ryoka Matsushima ◽  
...  
Keyword(s):  
Electron Beam ◽  
Nonlinear Optical ◽  
Electron Beam Irradiation ◽  
Polymeric Films ◽  
Fabrication Technique ◽  
Beam Irradiation ◽  
Optical Structure

Nonlinear-optical characterization of planar domain patterns written in LiNbO3 by electron-beam irradiation

2018 ◽  
Vol 75 ◽  
pp. 325-330 ◽  
Author(s):  
S.D. Lavrov ◽  
L.S. Kokhanchik ◽  
R.V. Gainutdinov ◽  
A.S. Elshin ◽  
Ya.V. Bodnarchuk ◽  
...  
Keyword(s):  
Electron Beam ◽  
Nonlinear Optical ◽  
Electron Beam Irradiation ◽  
Optical Characterization ◽  
Planar Domain ◽  
Beam Irradiation

Methods to Monitor and Improve the Performance of Specimen Holders for Transmission Electron Cryomicroscopy

1996 ◽  
Vol 54 ◽  
pp. 454-455
Author(s):  
B. L. Armbruster ◽  
B. Kraus ◽  
M. Pan
Keyword(s):  
Electron Microscopy ◽  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Beam Irradiation ◽  
Quality Of Data ◽  
Electron Cryomicroscopy ◽  
Thermal Equilibration ◽  
Transmission Electron ◽  
Electron Microscopes

One goal in electron microscopy of biological specimens is to improve the quality of data to equal the resolution capabilities of modem transmission electron microscopes. Radiation damage and beam- induced movement caused by charging of the sample, low image contrast at high resolution, and sensitivity to external vibration and drift in side entry specimen holders limit the effective resolution one can achieve. Several methods have been developed to address these limitations: cryomethods are widely employed to preserve and stabilize specimens against some of the adverse effects of the vacuum and electron beam irradiation, spot-scan imaging reduces charging and associated beam-induced movement, and energy-filtered imaging removes the “fog” caused by inelastic scattering of electrons which is particularly pronounced in thick specimens.Although most cryoholders can easily achieve a 3.4Å resolution specification, information perpendicular to the goniometer axis may be degraded due to vibration. Absolute drift after mechanical and thermal equilibration as well as drift after movement of a holder may cause loss of resolution in any direction.

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