Characterization of the KDP crystals used in large-aperture doublers and triplers

2005 ◽  
Author(s):  
Andrius Melninkaitis ◽  
Modestas Sinkevicius ◽  
Tadas Lipinskas ◽  
Nerijus Slavinskis ◽  
Valdas Sirutkaitis ◽  
...  
Keyword(s):  
Large Aperture ◽  
Kdp Crystals

Characterization of KDP crystals used in large aperture doublers and triplers

2006 ◽  
Author(s):  
Martynas Barkauskas ◽  
Andrius Melninkaitis ◽  
Darius Mikšys ◽  
Loreta Meslinaitė ◽  
Rimantas Grigonis ◽  
...  
Keyword(s):  
Large Aperture ◽  
Kdp Crystals

A multimodal method for defect characterization of large-aperture optics

2021 ◽  
Author(s):  
Jian Chen ◽  
Weiyang Yu ◽  
Haifeng Zhou ◽  
Jian Zhang ◽  
Xi Wang ◽  
...  
Keyword(s):  
Defect Characterization ◽  
Large Aperture ◽  
Multimodal Method

Growth and characterization of KDP crystals doped with l-aspartic acid

2013 ◽  
Vol 104 ◽  
pp. 310-314 ◽  
Author(s):  
R. Krishnamurthy ◽  
R. Rajasekaran ◽  
Bincy Susan Samuel
Keyword(s):  
Aspartic Acid ◽  
Kdp Crystals

Characteristics of Laser-Induced Surface Damage on Large-Aperture KDP Crystals at 351 nm

2015 ◽  
Vol 32 (2) ◽  
pp. 027801 ◽  
Author(s):  
Ye Tian ◽  
Wei Han ◽  
Hua-Bao Cao ◽  
Fu-Quan Li ◽  
Bin Feng ◽  
...  
Keyword(s):  
Surface Damage ◽  
Large Aperture ◽  
Kdp Crystals

Growth and characterization of KDP crystals with potassium carbonate as additive

2008 ◽  
Vol 310 (24) ◽  
pp. 5341-5346 ◽  
Author(s):  
P.V. Dhanaraj ◽  
C.K. Mahadevan ◽  
G. Bhagavannarayana ◽  
P. Ramasamy ◽  
N.P. Rajesh
Keyword(s):  
Potassium Carbonate ◽  
Kdp Crystals

scholarly journals Characterization of a piezo bendable X-ray mirror

2016 ◽  
Vol 23 (1) ◽  
pp. 169-175 ◽  
Author(s):  
Maurizio Vannoni ◽  
Idoia Freijo Martín ◽  
Frank Siewert ◽  
Riccardo Signorato ◽  
Fan Yang ◽  
...  
Keyword(s):  
Full Scale ◽  
Optical Component ◽  
Fizeau Interferometer ◽  
X Ray ◽  
Large Aperture ◽  
Substrate Side ◽  
Side Face ◽  
Measuring Machine ◽  
Reflecting Surface

A full-scale piezo bendable mirror built as a prototype for an offset mirror at the European XFEL is characterized. The piezo ceramic elements are glued onto the mirror substrate, side-face on with respect to the reflecting surface. Using a nanometre optical component measuring machine and a large-aperture Fizeau interferometer, the mirror profile and influence functions were characterized, and further analysis was made to investigate the junction effect, hysteresis, twisting and reproducibility.

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