Tunneling and spatial resolution in near-field optics

2004 ◽  
Author(s):  
Gleb S. Zhdanov
Keyword(s):  
Spatial Resolution ◽  
Near Field ◽  
Near Field Optics

MAGNETO-OPTICS OF QUANTUM DOTS IN THE NEAR FIELD

2007 ◽  
Vol 21 (08n09) ◽  
pp. 1649-1653
Author(s):  
CONSTANTINOS SIMSERIDES ◽  
ANNA ZORA ◽  
GEORGIOS TRIBERIS
Keyword(s):  
Magnetic Field ◽  
Spatial Resolution ◽  
Near Field ◽  
Resolving Power ◽  
Zero Magnetic Field ◽  
Far Field ◽  
Field Orientation ◽  
Structural Symmetry ◽  
Near Field Optics ◽  
The Magnetic Field

We examine a quantum dot (QD) illuminated in the near field with subwavelength spatial resolution, while simultaneously it is subjected to a magnetic field of variable orientation and magnitude. The magnetic field orientation can conserve or destroy the zero-magnetic-field ("structural") symmetry. The asymmetry induced by the magnetic field -except for specific orientations along symmetry axes- can be uncovered in the near-field (NF) but not in the far-field (FF) spectra. We predict that NF magnetoabsorption experiments of realistic spatial resolution could reveal the QD symmetry. This exceptional symmetry-resolving power of the near-field optics, is lost in the far field.

Laser Nano-Machining Using Near-Field Optics

2004 ◽  
Author(s):  
Haseung Chung ◽  
Katsuo Kurabayashi ◽  
Suman Das
Keyword(s):  
Refractive Index ◽  
Spatial Resolution ◽  
Near Field ◽  
Numerical Aperture ◽  
Diffraction Limit ◽  
High Density ◽  
Index Of Refraction ◽  
Optical Technique ◽  
Near Field Optics ◽  
Maximum Angle

A near-field optical technique, using a new type of solid immersion lens (SIL), has been developed and applied to various areas, for example, high-density optical storage, near-field-scanning-optical-microscope probes, photolithography. Solid immersion microscopy offers a method for achieving resolution below the diffraction limit in air with significantly higher optical throughput by focusing light through a high refractive-index SIL held close to a sample [1]. The minimum resolution of a focusing system is inversely proportional to numerical aperture (NA), where NA = n sinθ, θ is the maximum angle of incidence, and n is the index of refraction at the focal point. Light with vacuum wavelength λ can be focused by an aberration-free lens to a spot whose full width at half maximum (FWHM) is λ/(2 NA) in the scalar diffraction limit, equivalent to Sparrow’s criterion for spatial resolution. In a medium of refractive index n, the effective wavelength is λeff = λ/n and corresponding effective numerical aperture is NAeff = n2sinθ. When a SIL is used, improvements in NAeff and spatial resolution are proportional to the refractive index of the SIL material. Fletcher et al. demonstrated imaging in the infrared with a microfabricated SIL [1, 2]. Baba et al. analyzed the aberrations and allowances for an aspheric error, a thickness error, and an air gap when using a hemispherical SIL for photoluminescence microscopy with submicron resolution beyond the diffraction limit [3]. Terris et al. developed and applied a SIL-based near-field optical technique for the writing and reading domains in a magneto-optic material [4]. Song et al. proposed the new concept of a SIL for high density optical recording using the near-field recording technology [5]. In this paper, we propose a sub-micron scale laser processing technique with spatial resolution beyond the diffraction limit in air using near-field optics. Our goal is to eventually develop a massively parallel nano-optical direct-write nano-manufacturing technique.

Spatiially Resolved Spectra of Miicro-Crystals and Nano-Aggiregates in Doped Polymers

1992 ◽  
Vol 290 ◽  
Author(s):  
Duane Birnbaum ◽  
Seong-Keun Kook ◽  
Raoul Kopelman
Keyword(s):  
Spatial Resolution ◽  
Fluorescence Spectra ◽  
Near Field ◽  
Emission Spectra ◽  
Optical Diffraction ◽  
Near Field Optics ◽  
Spatially Resolved ◽  
Doped Polymers ◽  
Doped Polymer ◽  
Near Field Scanning

AbstractNear-field optics techniques make it possible to by-pass the optical diffraction limit (“uncertainty principle) and attain spatial resolution of λ/50 or better. We present near-field scanning optical spectroscopy (NSOS) data on α and ß mixed micro-crystals of perylene and on various aggregates of tetracene doped into PMMA. The spatial resolution is limited by the size of the scanning photon tip and its distance from the sample. We use nanofabricated optical fiber tips (aluminum coated) that are as small as 100 nm. These can be piezoelectrically scanned close to the sample. Fluorescence spectra easily differentiate between adjoining microcrystallites of α and β perylene, giving spectra identical with those of large (>1 cm) single crystals. The apparently homogeneous molecularly doped polymer samples of tetracene/PMMA have regions that fluoresce anywhere between green and red. Thus the spatially resolved spectra are much sharper and more detailed than the broad and featureless bulk spectra. The different emission spectra are attributed to different aggregates of the tetracene guest embedded in the PMMA host

Simultaneous observation of light localization and confinement in near-field optics

2001 ◽  
Vol 56 (4) ◽  
pp. 517-522 ◽  
Author(s):  
D Peyrade ◽  
R Quidant ◽  
J.-C Weeber ◽  
A Dereux ◽  
G Lévêque ◽  
...  
Keyword(s):  
Near Field ◽  
Simultaneous Observation ◽  
Near Field Optics ◽  
Light Localization

scholarly journals Improvement of spatial resolution by tilt correction in near-field scanning microwave microscopy

AIP Advances ◽  
2021 ◽  
Vol 11 (3) ◽  
pp. 035114
Author(s):  
Xianfeng Zhang ◽  
Zhe Wu ◽  
Quansong Lan ◽  
Zhiliao Du ◽  
Quanxin Zhou ◽  
...  
Keyword(s):  
Spatial Resolution ◽  
Near Field ◽  
Tilt Correction ◽  
Microwave Microscopy ◽  
Scanning Microwave Microscopy ◽  
Near Field Scanning
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