High-performance and low-thermal time constant amorphous silicon-based 320 x 240 uncooled microbolometer IRFPA

2005 ◽  
Author(s):  
Jean-Luc Tissot ◽  
Jean-Pierre Chatard ◽  
Bruno Fieque ◽  
Olivier Legras
Keyword(s):  
Amorphous Silicon ◽  
Time Constant ◽  
High Performance ◽  
Thermal Time ◽  
Thermal Time Constant ◽  
Uncooled Microbolometer ◽  
Silicon Based

An Optimization Approach for 25um Pitch Microbolometers

2012 ◽  
Vol 602-604 ◽  
pp. 2259-2262
Author(s):  
Hong Xi Zhou ◽  
Chao Chen ◽  
Tao Wang
Keyword(s):  
Optimum Design ◽  
Time Constant ◽  
High Performance ◽  
Low Noise ◽  
Thermal Time ◽  
Design Parameters ◽  
Physical Parameters ◽  
Optimization Approach ◽  
Thermal Time Constant ◽  
Trade Offs

In this paper a high-performance single level uncooled microbolometer detectors with a unit cell size of 25um×25um is introduced. An efficient detectors requires low Noise Equivalent Temperature Difference(NETD) (<80mK,f/1,60Hz)and low thermal time constant (<8.3ms). The trade-offs between physical parameters are studied to attain the optimum design parameters including the thermal conductance, the thermal time constant and the active area, consequently, optimum design parameters such as the width and the length of the support arms, which can satisfy the demand of an efficient detectors is achieved.

High performance of Ni0.9Mn1.8Mg0.3O4 spinel nanoceramic microbeads via inkjet printing and two step sintering

RSC Advances ◽  
2016 ◽  
Vol 6 (41) ◽  
pp. 35118-35123 ◽  
Author(s):  
Long Chen ◽  
Junhua Wang ◽  
Cuiping Huang ◽  
Qinan Zhang ◽  
Shannan Chang ◽  
...  
Keyword(s):  
Electrical Properties ◽  
Time Constant ◽  
Inkjet Printing ◽  
High Performance ◽  
Material Constant ◽  
Thermal Time ◽  
Sintering Process ◽  
Thermal Time Constant

The effect of two step sintering process on the microstructure and electrical properties of inkjet printing high performance Ni0.9Mn1.8Mg0.3O4 ceramic microbead materials with lower thermal time constant and higher material constant is investigated.

The Thermal Conductance Estimation of Uncooled Microbolometer

2012 ◽  
Vol 531-532 ◽  
pp. 477-480
Author(s):  
Chao Chen ◽  
Ya Dong Jiang ◽  
Hong Xi Zhou
Keyword(s):  
Time Constant ◽  
Theoretical Calculations ◽  
Three Dimensional ◽  
Thermal Conductance ◽  
Thermal Time ◽  
Ir Detector ◽  
Time Curve ◽  
Three Dimensional Modeling ◽  
Thermal Time Constant ◽  
Uncooled Microbolometer

Thermal conductance of microbolometer has a directly impact on Noise Equivalent Temperature Difference (NETD) and thermal time constant which are the key indicators of uncooled IR detector. It is of great significance to calculate and evaluate thermal conductance. A calculate approach of thermal conductance for uncooled microbolometer detectors is introduced in this paper. Accurate three-dimensional modeling of microbolometer is found by using MEMS analysis software Intellisuite. Dynamic thermal analysis of this model is solved and then thermal time constant can be read from thermal time curve of the analysis mentioned above. Combined with the calculation of thermal capacitance, more precisely thermal conductance value can be reached which is more accurate than theoretical calculations result and meaningful for design and fabrication of the device.

Uncooled IRFPA with high-performance and low-thermal time constant

2004 ◽  
Author(s):  
Jean Luc Tissot ◽  
Michel Vilain ◽  
Arnaud Crastes ◽  
Sebastien Tinnes ◽  
Annick Larre ◽  
...  
Keyword(s):  
Time Constant ◽  
High Performance ◽  
Thermal Time ◽  
Thermal Time Constant

A test method of thermal time constant for uncooled infrared focal plane array

2019 ◽  
Vol 48 (12) ◽  
pp. 1204003
Author(s):  
刘子骥 Liu Ziji ◽  
赵晟晨 Zhao Shengchen ◽  
赵征庭 Zhao Zhengting ◽  
李聿达 Li Yuda ◽  
郑 兴 Zheng Xing ◽  
...  
Keyword(s):  
Time Constant ◽  
Focal Plane ◽  
Focal Plane Array ◽  
Test Method ◽  
Thermal Time ◽  
Infrared Focal Plane Array ◽  
Thermal Time Constant

Fast and rigorous use of thermal time constant to characterize back end of the line test structure in advanced technology

2008 ◽  
Vol 48 (8-9) ◽  
pp. 1279-1284
Author(s):  
A. Reverdy ◽  
P. Perdu ◽  
H. Murray ◽  
M. de la Bardonnie ◽  
P. Poirier
Keyword(s):  
Time Constant ◽  
Test Structure ◽  
Advanced Technology ◽  
Thermal Time ◽  
Thermal Time Constant ◽  
Line Test
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