New scanning probe microscope with versatile near-field optical microscopy measuring head

2004 ◽  
Author(s):  
Yuri P. Volkov ◽  
Vil B. Baiburin ◽  
Roman A. Yakimenko ◽  
Nickolay V. Vakuliuk
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Measuring Head ◽  
Probe Microscope

Nanostructuring With Scanning Probe Microscope Tip Irradiated With Femtosecond Laser

2002 ◽  
Author(s):  
Anant Chimmalgi ◽  
Taeyoul Choi ◽  
Costas P. Grigoropoulos
Keyword(s):  
Femtosecond Laser ◽  
Data Storage ◽  
Near Field ◽  
Laser System ◽  
Ambient Air ◽  
Femtosecond Laser Pulses ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Fdtd Simulation ◽  
Probe Microscope

Nanostructures, which have characteristic dimensions that are difficult to achieve by conventional optical lithography techniques, are finding ever-increasing applications in a variety of fields. High resolution, reliability and throughput fabrication of these nanostructures is essential if applications incorporating nanodevices are to gain widespread acceptance. Owing to the minimal thermal and mechanical damage, ultra-short pulsed laser radiation has been shown to be effective for precision material processing and surface micro-modification. In this work, nanostructuring based on local field enhancement in the near field of a Scanning Probe Microscope (SPM) probe tip irradiated with femtosecond laser pulses has been studied. High spatial resolution (~10–12nm), flexibility in the choice of the substrate material and possibility of massive integration of the tips make this method highly attractive for nanomodification. We report results of nanostructuring of gold thin film utilizing an 800nm femtosecond laser system in conjunction with a commercial SPM in ambient air. Further, Finite Difference Time Domain (FDTD) simulation results for the spatial distribution of the laser field intensity beneath the tip are presented. Potential applications of this method include nanolithography, nanodeposition, high-density data storage, as well as various biotechnology related applications.

Terahertz Coherent Scanning Probe Microscope

2010 ◽  
Vol 5 (4) ◽  
pp. 151-153
Author(s):  
Valeriy N. Trukhin ◽  
Nikolay N. Zinov’ev ◽  
Aleksandr V. Andrianov ◽  
Leonid L. Samoilov ◽  
Aleksandr O. Golubok ◽  
...  
Keyword(s):  
Scattered Radiation ◽  
Electromagnetic Waves ◽  
Near Field ◽  
Harmonic Signal ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Signal Demodulation ◽  
Probe Microscope

We present the terahertz (THz) scanning probe microscope which combines a THz coherent spectrometer and a scanning probe microscope. It detects forward-scattered radiation and employs harmonic signal demodulation to extract the signal of near-field contribution to scattering of THz electromagnetic waves

A planar scanning probe microscope for near-field microscopy

2020 ◽  
Author(s):  
Paul Weinbrenner ◽  
Stefan Ernst ◽  
Dominik M. Irber ◽  
Friedemann Reinhard
Keyword(s):  
Near Field ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Probe Microscope

Scanning-probe microscope analysis of optical thin films: A new analytical tool in a manufacturing environment

1994 ◽  
Vol 52 ◽  
pp. 1068-1069
Author(s):  
S. P. Sapers ◽  
R. Clark ◽  
P. Somerville
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Thermal Control ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
List Type ◽  
Manufacturing Environment ◽  
Physical Measurements ◽  
Probe Microscope

OCLI is a leading manufacturer of thin films for optical and thermal control applications. The determination of thin film and substrate topography can be a powerful way to obtain information for deposition process design and control, and about the final thin film device properties. At OCLI we use a scanning probe microscope (SPM) in the analytical lab to obtain qualitative and quantitative data about thin film and substrate surfaces for applications in production and research and development. This manufacturing environment requires a rapid response, and a large degree of flexibility, which poses special challenges for this emerging technology. The types of information the SPM provides can be broken into three categories:(1)Imaging of surface topography for visualization purposes, especially for samples that are not SEM compatible due to size or material constraints;(2)Examination of sample surface features to make physical measurements such as surface roughness, lateral feature spacing, grain size, and surface area;(3)Determination of physical properties such as surface compliance, i.e. “hardness”, surface frictional forces, surface electrical properties.

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