Second-order susceptibility measurement of thin films by reflective second harmonic generation method: toward measurement standards in nonlinear optics
Keyword(s):
1991 ◽
Vol 30
(Part 1, No. 5)
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pp. 1050-1062
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Keyword(s):
2016 ◽
Vol 30
(22)
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pp. 1650138
2001 ◽
Vol 481
(1-3)
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pp. 105-112
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Keyword(s):
1994 ◽
Vol 26
(6)
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pp. 609-627
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2008 ◽
Vol 2
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pp. 31-38
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2005 ◽
Vol 14
(03)
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pp. 357-365
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