Scanning white light interferometry for quality control of transparent polymer films

2004 ◽  
Author(s):  
Ivan I. Kassamakov ◽  
Juha P. Aaltonen ◽  
Edward Haeggstrom ◽  
Mathias Osterberg
Keyword(s):  
Quality Control ◽  
Polymer Films ◽  
White Light ◽  
White Light Interferometry ◽  
Scanning White Light Interferometry

Hybrid light source for scanning white light interferometry-based MEMS quality control

2011 ◽  
Author(s):  
V. Heikkinen ◽  
K. Hanhijärvi ◽  
J. Aaltonen ◽  
H. Räikkönen ◽  
B. Wälchli ◽  
...  
Keyword(s):  
Quality Control ◽  
Light Source ◽  
White Light ◽  
White Light Interferometry ◽  
Scanning White Light Interferometry

Scanning white light interferometry in quality control of single-point tape automated bonding

2007 ◽  
Vol 84 (1) ◽  
pp. 114-123 ◽  
Author(s):  
Ivan Vl. Kassamakov ◽  
Henri O. Seppänen ◽  
Markku J. Oinonen ◽  
Edward O. Hæggström ◽  
J. Mathias Österberg ◽  
...  
Keyword(s):  
Quality Control ◽  
White Light ◽  
Single Point ◽  
White Light Interferometry ◽  
Scanning White Light Interferometry

Characterization of dents and grooves on polymer films using scanning white light interferometry

2006 ◽  
Author(s):  
Ivan Kassamakov ◽  
Kari Ojala ◽  
Ari Salmi ◽  
Edward Hæggström ◽  
Juha Aaltonen ◽  
...  
Keyword(s):  
Polymer Films ◽  
White Light ◽  
White Light Interferometry ◽  
Scanning White Light Interferometry

Scanning white light interferometry in quality control of single-point tape automated bonding

2004 ◽  
Author(s):  
Henri Seppanen ◽  
Ivan I. K. Kassamakov ◽  
Markku Oinonen ◽  
Edward H†ggstrom ◽  
Juha P. Aaltonen ◽  
...  
Keyword(s):  
Quality Control ◽  
White Light ◽  
Single Point ◽  
White Light Interferometry ◽  
Scanning White Light Interferometry

scholarly journals Integrated, Speckle-Based Displacement Measurement for Lateral Scanning White Light Interferometry

Sensors ◽  
2021 ◽  
Vol 21 (7) ◽  
pp. 2486
Author(s):  
Gert Behrends ◽  
Dirk Stöbener ◽  
Andreas Fischer
Keyword(s):  
White Light ◽  
Lateral Displacement ◽  
Displacement Measurement ◽  
Accurate Information ◽  
White Light Interferometry ◽  
Fully Integrated ◽  
Speckle Correlation ◽  
Dsc Measurements ◽  
Scanning White Light Interferometry ◽  
The Impact

Lateral scanning white light interferometry (LSWLI) is a promising technique for high-resolution topography measurements on moving surfaces. To achieve resolutions typically associated with white light interferometry, accurate information on the lateral displacement of the measured surface is essential. Since the uncertainty requirement for a respective displacement measurement is currently not known, Monte Carlo simulations of LSWLI measurements are carried out at first to assess the impact of the displacement uncertainty on the topography measurement. The simulation shows that the uncertainty of the displacement measurement has a larger influence on the total height uncertainty than the uncertainty of the displacing motion itself. Secondly, a sufficiently precise displacement measurement by means of digital speckle correlation (DSC) is proposed that is fully integrated into the field of view of the interferometer. In contrast to externally applied displacement measurement systems, the integrated combination of DSC with LSWLI needs no synchronization and calibration, and it is applicable for translatory as well as rotatory scans. To demonstrate the findings, an LSWLI setup with integrated DSC measurements is realized and tested on a rotating cylindrical object with a surface made of a linear encoder strip.

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