Characterization of coplanar grid CZT detectors with highly collimated x-ray beam

2004 ◽  
Author(s):  
Gabriella A. Carini ◽  
Aleksey E. Bolotnikov ◽  
Giuseppe S. Camarda ◽  
Gomez W. Wright ◽  
Gianluigi De Geronimo ◽  
...  
Keyword(s):  
X Ray ◽  
Coplanar Grid ◽  
Czt Detectors

Multipixel characterization of imaging CZT detectors for hard x-ray imaging and spectroscopy

2004 ◽  
Author(s):  
Santosh V. Vadawale ◽  
Jae Sub Hong ◽  
Jonathan E. Grindlay ◽  
Peter Williams ◽  
Minhua Zhang ◽  
...  
Keyword(s):  
X Ray ◽  
X Ray Imaging ◽  
Imaging And Spectroscopy ◽  
Czt Detectors

scholarly journals Synchrotron radiation response characterization of coplanar grid CZT detectors

2005 ◽  
Vol 52 (5) ◽  
pp. 1941-1944 ◽  
Author(s):  
G.A. Carini ◽  
A.E. Bolotnikov ◽  
G.S. Camarda ◽  
G.W. Wright ◽  
G. De Geronimo ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Radiation Response ◽  
Coplanar Grid ◽  
Czt Detectors

scholarly journals Synchrotron radiation response characterization of coplanar grid CZT detectors

2005 ◽  
Author(s):  
G.A. Carini ◽  
A.E. Bolotnikov ◽  
G.S. Camarda ◽  
G.W. Wright ◽  
G. De Geronimo ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Radiation Response ◽  
Coplanar Grid ◽  
Czt Detectors

scholarly journals Characterization of Redlen CZT detectors for x-ray astronomy

2018 ◽  
Author(s):  
Sean M. Pike ◽  
Hiromasa Miyasaka ◽  
Fiona A. Harrison ◽  
Jill Burnham ◽  
Brian W. Grefenstette ◽  
...  
Keyword(s):  
X Ray ◽  
Czt Detectors

A CMOS ANALOG INTEGRATED CIRCUIT FOR PIXEL X-RAY DETECTOR

2011 ◽  
Vol 20 (01) ◽  
pp. 71-87 ◽  
Author(s):  
DAVID FITRIO ◽  
SUHARDI TJOA ◽  
ANAND MOHAN ◽  
RONNY VELJANOVSKI ◽  
ANDREW BERRY ◽  
...  
Keyword(s):  
Integrated Circuit ◽  
Future Research ◽  
Pulse Shaper ◽  
X Ray ◽  
Application Specific Integrated Circuit ◽  
A Charge ◽  
Czt Detectors ◽  
Cmos Analog Integrated Circuit ◽  
Application Specific

A front-end read-out application specific integrated circuit (ASIC) for a multichannel pixel X-Ray detector system has been fabricated and tested. The chip provides signal amplification for pixelated compound semiconductors such as Cadmium Telluride ( CdTe ) and Cadmium Zinc Telluride ( CZT ) with either 1 mm or 200 μm pitch. Both the detector (compound semiconductor) and ASIC are combined to target future research applicable to spectroscopic imaging in high intensity X-Ray biomedical detector systems. The ASIC was fabricated in a 0.35 μm process by Austria Microsystems and consists of 32 channels, where each channel contains a charge-sensitive amplifier, a pulse shaper and two further stages of amplification providing an overall gain of 1 mV per kilo electron volt (keV) for photons within the energy range of 30–120 keV. The preamplifier and shaper circuits are designed for both positive and negative charge collection (electrons and holes) produced by the CdTe or CZT detectors. The ASIC's shaper has been designed with a time constant of 100 ns to allow operation at photon rate events above 1 Million photons per pixel per second. The design and characterization of the readout chip will be discussed in this paper presenting results from both the simulated and the fabricated chip.

scholarly journals Characterization of Redlen CZT detectors for hard x-ray astronomy

2018 ◽  
Author(s):  
Sean M. Pike ◽  
Fiona Harrison ◽  
Brian Grefenstette ◽  
Kristin Madsen ◽  
Hiromasa Miyasaka ◽  
...  
Keyword(s):  
X Ray ◽  
Czt Detectors

Characterization of a New ASIC Readout for Pixel CZT Detectors for Hard X-Ray Astronomy

2006 ◽  
Author(s):  
Giulio Ventura ◽  
Ezio Caroli ◽  
Natalia Auricchio ◽  
Giuseppe Bertuccio ◽  
Stefano Caccia ◽  
...  
Keyword(s):  
X Ray ◽  
Czt Detectors

The Use of Advanced Analytical Techniques for Characterization of the Chemical, Physical, and Crystallographic Nature of a Surface

1973 ◽  
Vol 31 ◽  
pp. 132-133 ◽  
Author(s):  
R. E. Herfert
Keyword(s):  
Surface Characterization ◽  
Analytical Techniques ◽  
X Ray Diffraction ◽  
Depth Of Penetration ◽  
X Ray ◽  
The Past ◽  
Transmission Electron ◽  
Scanning Electron

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.

High Resolution Replication of Organoclay Surfaces

1982 ◽  
Vol 40 ◽  
pp. 576-577
Author(s):  
W. W. Barker ◽  
W. E. Rigsby ◽  
V. J. Hurst ◽  
W. J. Humphreys
Keyword(s):  
Clay Mineral ◽  
Organic Molecule ◽  
Organic Molecules ◽  
X Ray Diffraction ◽  
Xrd Pattern ◽  
X Ray ◽  
Naturally Occurring ◽  
Silicate Layers ◽  
Mineral Identification

Experimental clay mineral-organic molecule complexes long have been known and some of them have been extensively studied by X-ray diffraction methods. The organic molecules are adsorbed onto the surfaces of the clay minerals, or intercalated between the silicate layers. Natural organo-clays also are widely recognized but generally have not been well characterized. Widely used techniques for clay mineral identification involve treatment of the sample with H2 O2 or other oxidant to destroy any associated organics. This generally simplifies and intensifies the XRD pattern of the clay residue, but helps little with the characterization of the original organoclay. Adequate techniques for the direct observation of synthetic and naturally occurring organoclays are yet to be developed.

Digital x-ray mapping of nanometer-size supported bimetallic catalysts

1988 ◽  
Vol 46 ◽  
pp. 530-531
Author(s):  
L. T. Germinario
Keyword(s):  
Background Radiation ◽  
Metal Cluster ◽  
Single Element ◽  
Beam Diameter ◽  
X Rays ◽  
X Ray ◽  
Major Interest ◽  
Induced Changes

Understanding the role of metal cluster composition in determining catalytic selectivity and activity is of major interest in heterogeneous catalysis. The electron microscope is well established as a powerful tool for ultrastructural and compositional characterization of support and catalyst. Because the spatial resolution of x-ray microanalysis is defined by the smallest beam diameter into which the required number of electrons can be focused, the dedicated STEM with FEG is the instrument of choice. The main sources of errors in energy dispersive x-ray analysis (EDS) are: (1) beam-induced changes in specimen composition, (2) specimen drift, (3) instrumental factors which produce background radiation, and (4) basic statistical limitations which result in the detection of a finite number of x-ray photons. Digital beam techniques have been described for supported single-element metal clusters with spatial resolutions of about 10 nm. However, the detection of spurious characteristic x-rays away from catalyst particles produced images requiring several image processing steps.

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