Nonlinear optical isolators based on high-reflectivity Brillouin mirrors and their application to advanced lasers

1992 ◽  
Vol 31 (2) ◽  
pp. 328 ◽  
Author(s):  
Steven M. Jackel
Keyword(s):  
Nonlinear Optical ◽  
High Reflectivity ◽  
Optical Isolators

scholarly journals Passive Nonlinear Optical Isolators Bypassing Dynamic Reciprocity

2021 ◽  
Vol 16 (1) ◽  
Author(s):  
Yiqi Hu ◽  
Yihong Qi ◽  
Yu You ◽  
Shicheng Zhang ◽  
Gongwei Lin ◽  
...  
Keyword(s):  
Nonlinear Optical ◽  
Optical Isolators

Experimental Demonstration of Non-Hermitian on-chip Nonlinear Optical Isolators

CLEO: 2013 ◽  
2013 ◽  
Author(s):  
Yat-Ming Ho ◽  
Armando Perez-Leija ◽  
Ramy El-Ganainy ◽  
Patrick LiKamwa ◽  
Gregory Salamo ◽  
...  
Keyword(s):  
Nonlinear Optical ◽  
Experimental Demonstration ◽  
Optical Isolators ◽  
On Chip

Low-loss nonlinear optical isolators in silicon

2020 ◽  
Vol 14 (6) ◽  
pp. 338-339 ◽  
Author(s):  
Eric A. Kittlaus ◽  
Peter O. Weigel ◽  
William M. Jones
Keyword(s):  
Nonlinear Optical ◽  
Low Loss ◽  
Optical Isolators

Limitations of nonlinear optical isolators due to dynamic reciprocity

2015 ◽  
Vol 9 (6) ◽  
pp. 388-392 ◽  
Author(s):  
Yu Shi ◽  
Zongfu Yu ◽  
Shanhui Fan
Keyword(s):  
Nonlinear Optical ◽  
Optical Isolators

Roughness measurements of nonlinear optical polymer films by scanning tunneling microscopy

1989 ◽  
Vol 47 ◽  
pp. 22-23
Author(s):  
I. H. Musselman ◽  
R.-T. Chen ◽  
P. E. Russell
Keyword(s):  
Surface Roughness ◽  
Scanning Tunneling Microscopy ◽  
Nonlinear Optical ◽  
Polymer Surface ◽  
Light Extinction ◽  
Scanning Tunneling ◽  
Silicon Substrates ◽  
Tunneling Microscopy ◽  
Optical Polymer ◽  
Total Light

Scanning tunneling microscopy (STM) has been used to characterize the surface roughness of nonlinear optical (NLO) polymers. A review of STM of polymer surfaces is included in this volume. The NLO polymers are instrumental in the development of electrooptical waveguide devices, the most fundamental of which is the modulator. The most common modulator design is the Mach Zehnder interferometer, in which the input light is split into two legs and then recombined into a common output within the two dimensional waveguide. A π phase retardation, resulting in total light extinction at the output of the interferometer, can be achieved by changing the refractive index of one leg with respect to the other using the electrooptic effect. For best device performance, it is essential that the NLO polymer exhibit minimal surface roughness in order to reduce light scattering. Scanning tunneling microscopy, with its high lateral and vertical resolution, is capable of quantifying the NLO polymer surface roughness induced by processing. Results are presented below in which STM was used to measure the surface roughness of films produced by spin-coating NLO-active polymers onto silicon substrates.

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