User interfaces for process modeling and detection systems

Gesture-Based Process Modeling Using Multi-Touch Devices

International Journal of Information System Modeling and Design ◽

10.4018/ijismd.2013100103 ◽

2013 ◽

Vol 4 (4) ◽

pp. 48-69 ◽

Cited By ~ 6

Author(s):

Jens Kolb ◽

Benjamin Rudner ◽

Manfred Reichert

Keyword(s):

Business Process ◽

User Interfaces ◽

Process Modeling ◽

Business Process Modeling ◽

Process Models ◽

Modeling Tools ◽

Business Process Models ◽

Desktop Computers ◽

Touch Devices ◽

Collaborative Business Process

Contemporary business process modeling tools provide menu-based user interfaces for defining and visualizing process models. Such menu-based interactions have been optimized for applications running on desktop computers, but are limited regarding their use on multi-touch devices. At the same time, the widespread use of mobile devices in daily business life as well as their multi-touch capabilities offer promising perspectives for intuitively defining and changing business process models. Additionally, multi-touch tables will foster collaborative business process modeling based on natural as well as intuitive gestures and interactions. This paper presents the results of an experiment that investigated the way users define and change business process models using multi-touch devices. Based on experiment results, a core gesture set is designed enabling the easy definition and change of business process models with multi-touch devices. Finally, a proof-of-concept implementation of this core gesture set is presented. Overall, gesture-based process modeling and multi-touch devices will foster new ways of (collaborative) business process modeling.

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Support of surgical process modeling by using adaptable software user interfaces

10.1117/12.844094 ◽

2010 ◽

Author(s):

T. Neumuth ◽

B. Kaschek ◽

M. Czygan ◽

D. Goldstein ◽

G. Strauß ◽

...

Keyword(s):

User Interfaces ◽

Process Modeling ◽

Surgical Process Modeling

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The Potentials of Scanning Microscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100101505 ◽

1968 ◽

Vol 26 ◽

pp. 352-353

Author(s):

A. V. Crewe

Keyword(s):

Salient Feature ◽

Secondary Emission ◽

Resolving Power ◽

X Rays ◽

Scanning Microscope ◽

Forming Process ◽

Additional Tool ◽

Detection Systems ◽

Conventional Microscope ◽

Present Information

If the resolving power of a scanning electron microscope can be improved until it is comparable to that of a conventional microscope, it would serve as a valuable additional tool in many investigations.The salient feature of scanning microscopes is that the image-forming process takes place before the electrons strike the specimen. This means that several different detection systems can be employed in order to present information about the specimen. In our own particular work we have concentrated on the use of energy loss information in the beam which is transmitted through the specimen, but there are also numerous other possibilities (such as secondary emission, generation of X-rays, and cathode luminescence).Another difference between the pictures one would obtain from the scanning microscope and those obtained from a conventional microscope is that the diffraction phenomena are totally different. The only diffraction phenomena which would be seen in the scanning microscope are those which exist in the beam itself, and not those produced by the specimen.

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Universal ESEM

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100149763 ◽

1993 ◽

Vol 51 ◽

pp. 786-787

Author(s):

G.D. Danilatos

Keyword(s):

Electron Microscope ◽

Scanning Electron Microscope ◽

High Vacuum ◽

Natural Extension ◽

Necessary Condition ◽

Environmental Scanning ◽

Detection Systems ◽

Small Gain ◽

Detection Medium ◽

Scanning Electron

The environmental scanning electron microscope (ESEM) has evolved as the natural extension of the scanning electron microscope (SEM), both historically and technologically. ESEM allows the introduction of a gaseous environment in the specimen chamber, whereas SEM operates in vacuum. One of the detection systems in ESEM, namely, the gaseous detection device (GDD) is based on the presence of gas as a detection medium. This might be interpreted as a necessary condition for the ESEM to remain operational and, hence, one might have to change instruments for operation at low or high vacuum. Initially, we may maintain the presence of a conventional secondary electron (E-T) detector in a "stand-by" position to switch on when the vacuum becomes satisfactory for its operation. However, the "rough" or "low vacuum" range of pressure may still be considered as inaccessible by both the GDD and the E-T detector, because the former has presumably very small gain and the latter still breaks down.

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