Bidirectional reflectance measurements for high-resolution signature modeling

Mapping Intimacies ◽

10.1117/12.548085 ◽

2004 ◽

Cited By ~ 1

Author(s):

James C. Jafolla ◽

William R. Reynolds

Keyword(s):

High Resolution ◽

Bidirectional Reflectance ◽

Reflectance Measurements

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Bidirectional reflectance measurements for high-resolution signature modeling

10.1117/12.276667 ◽

1997 ◽

Author(s):

David J. Thomas ◽

James C. Jafolla ◽

Peter J. Sarman

Keyword(s):

High Resolution ◽

Bidirectional Reflectance ◽

Reflectance Measurements

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Apparatus for spectral bidirectional reflectance measurements duringultraviolet irradiation in vacuum

10.2514/6.1965-672 ◽

1965 ◽

Cited By ~ 2

Author(s):

H. MACMILLAN ◽

L. MCKELLAR

Keyword(s):

Bidirectional Reflectance ◽

Reflectance Measurements

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Bidirectional reflectance measurements of specular and diffuse surfaces with a simple spectrometer

10.2514/6.1980-1529 ◽

1980 ◽

Author(s):

A. FUNAI

Keyword(s):

Bidirectional Reflectance ◽

Reflectance Measurements

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Bidirectional reflectance measurements from space with the EOS Multi-angle Imaging SpectroRadiometer (MISR)

10.2514/6.1994-598 ◽

1994 ◽

Author(s):

D. Diner ◽

J. Martonchik ◽

C. Bruegge

Keyword(s):

Bidirectional Reflectance ◽

Reflectance Measurements

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Wheat leaf bidirectional reflectance measurements: Description and quantification of the volume, specular and hot-spot scattering features

Remote Sensing of Environment ◽

10.1016/j.rse.2011.01.028 ◽

2012 ◽

Vol 121 ◽

pp. 26-35 ◽

Cited By ~ 29

Author(s):

A. Comar ◽

F. Baret ◽

F. Viénot ◽

L. Yan ◽

B. de Solan

Keyword(s):

Hot Spot ◽

Bidirectional Reflectance ◽

Wheat Leaf ◽

Reflectance Measurements

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Bidirectional reflectance measurements for one-dimensional randomly rough surfaces

10.2514/6.1979-1036 ◽

1979 ◽

Author(s):

T. SMITH ◽

R. SUITER ◽

K. KANAYAMA

Keyword(s):

Rough Surfaces ◽

Bidirectional Reflectance ◽

One Dimensional ◽

Randomly Rough Surfaces ◽

Reflectance Measurements

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High-resolution depth monitoring of reactive ion etching of InP/InGaAs(P) MQWs using reflectance measurements

Semiconductor Science and Technology ◽

10.1088/0268-1242/11/6/021 ◽

1996 ◽

Vol 11 (6) ◽

pp. 968-973 ◽

Cited By ~ 6

Author(s):

A Stano ◽

C Coriasso ◽

G Meneghini

Keyword(s):

High Resolution ◽

Reactive Ion Etching ◽

Ion Etching ◽

Reflectance Measurements

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Bidirectional reflectance measurements using a CCD-line-camera on a rotating device

IEEE 1999 International Geoscience and Remote Sensing Symposium. IGARSS'99 (Cat. No.99CH36293) ◽

10.1109/igarss.1999.773574 ◽

2003 ◽

Cited By ~ 1

Author(s):

M. Radke ◽

H.-P. Roser ◽

A. Demircan

Keyword(s):

Bidirectional Reflectance ◽

Reflectance Measurements

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Polarized single-scattering phase function determined for a common reflectance standard from bidirectional reflectance measurements

Polarization: Measurement, Analysis, and Remote Sensing XIII ◽

10.1117/12.2305417 ◽

2018 ◽

Author(s):

Thomas A. Germer

Keyword(s):

Phase Function ◽

Single Scattering ◽

Bidirectional Reflectance ◽

Scattering Phase ◽

Scattering Phase Function ◽

Reflectance Measurements

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Bidirectional-reflectance measurements for various snow crystal morphologies

Cold Regions Science and Technology ◽

10.1016/j.coldregions.2015.12.011 ◽

2016 ◽

Vol 124 ◽

pp. 110-117 ◽

Cited By ~ 2

Author(s):

Brad Stanton ◽

Daniel Miller ◽

Edward Adams ◽

Joseph A. Shaw

Keyword(s):

Bidirectional Reflectance ◽

Snow Crystal ◽

Reflectance Measurements

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