Research of D-T mixture molecular composition kinetics in laser thermonuclear fusion targets by Raman spectroscopy

2003 ◽  
Author(s):  
V. M. Izgorodin ◽  
A. P. Pepelyaev ◽  
E. U. Solomatina
Keyword(s):  
Raman Spectroscopy ◽  
Thermonuclear Fusion ◽  
Molecular Composition ◽  
Laser Thermonuclear Fusion

scholarly journals A converging shock wave for ignition of a pre-compressed target of laser thermonuclear fusion

2017 ◽  
pp. 1-20 ◽  
Author(s):  
Sergey Yurievich Guskov ◽  
Nikolay Vasilievich Zmitrenko ◽  
Orkhan Rahim oglu Rahimly
Keyword(s):  
Shock Wave ◽  
Thermonuclear Fusion ◽  
Laser Thermonuclear Fusion ◽  
Converging Shock Wave

Semiconductor Defects And Thin Films Characterization By High-Resolution Images And By Vibrational Spectroscopy.

1999 ◽  
Vol 5 (S2) ◽  
pp. 48-49
Author(s):  
G. Conti ◽  
Y.S. Uritsky ◽  
C. R. Brundle ◽  
J. Xu
Keyword(s):  
Raman Spectroscopy ◽  
High Resolution ◽  
Semiconductor Industry ◽  
Chemical Characterization ◽  
Molecular Composition ◽  
Wafer Surface ◽  
Root Cause ◽  
Analysis Technique ◽  
Inorganic Species ◽  
High Resolution Images

The physical and chemical characterization of defects and particles on wafer surfaces gives important information on their origin. An effective approach for root-cause determination of wafer surface particle problems is to perform both high-resolution images and chemical characterization on individual defects. The traditional root-cause analysis technique used in the semiconductor industry is Scanning Electron Microscopy combined with Energy Dispersive X-Ray Spectroscopy (SEM/EDX). This technique provides high-resolution images and the atomic composition of the defects. However, this is sometime insufficient to fully characterize them and to determine their origin. In this case, the identification of the molecular composition of the defects can help determine their origin.Optical spectroscopy, such as Infrared and Raman spectroscopy, is a powerful method for determining the molecular composition of many substances. Micro-FT-IR spectroscopy can characterize semiconductor particles only down to 10 μm because of the IR wavelength diffraction limit. Micro-Raman spectroscopy, instead, can provide useful molecular information on many organic as well as inorganic species with 1 μm spatial resolution.

scholarly journals Highly Efficient Spatially Offset Raman Spectroscopy to Profile Molecular Composition in Bone

IEEE Access ◽  
2020 ◽  
Vol 8 ◽  
pp. 62905-62911 ◽  
Author(s):  
Han Cui ◽  
Andrew Glidle ◽  
Jonathan M. Cooper
Keyword(s):  
Raman Spectroscopy ◽  
Molecular Composition ◽  
Highly Efficient

Films containing heavy hydrogen isotopes in laser thermonuclear fusion targets

1994 ◽  
Vol 24 (2) ◽  
pp. 145-147 ◽  
Author(s):  
Yu A Abramov ◽  
A V Bessarab ◽  
A V Veselov ◽  
P I Gavrilov ◽  
A A Druzhinin ◽  
...  
Keyword(s):  
Hydrogen Isotopes ◽  
Thermonuclear Fusion ◽  
Laser Thermonuclear Fusion
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