Model for the expansion dynamics of the laser-induced plasma and fabrication of erbium-doped planar waveguides by pulsed laser deposition and laser micromachining for up-conversion applications

2004 ◽  
Author(s):  
Jens Gottmann ◽  
Georg Schlaghecken ◽  
Ernst Wolfgang Kreutz
Keyword(s):  
Pulsed Laser Deposition ◽  
Pulsed Laser ◽  
Laser Micromachining ◽  
Planar Waveguides ◽  
Laser Deposition ◽  
Laser Induced Plasma ◽  
Erbium Doped

Pulsed laser deposition of Er:BaTiO3 for planar waveguides

2004 ◽  
Vol 79 (4-6) ◽  
pp. 1255-1257 ◽  
Author(s):  
G. Schlaghecken ◽  
J. Gottmann ◽  
E.W. Kreutz ◽  
R. Poprawe
Keyword(s):  
Pulsed Laser Deposition ◽  
Pulsed Laser ◽  
Planar Waveguides ◽  
Laser Deposition

scholarly journals Growth and Initial Experiments Demonstrating Watt Level Output From Yb:YAG Planar Waveguides Grown by Pulsed Laser Deposition

2015 ◽  
Author(s):  
Stephen J. Beecher ◽  
James A. Grant-Jacob ◽  
Tina L. Parsonage ◽  
Ping Hua ◽  
Amol Choudhary ◽  
...  
Keyword(s):  
Pulsed Laser Deposition ◽  
Pulsed Laser ◽  
Planar Waveguides ◽  
Laser Deposition

Erbium-doped waveguide fabrication via reactive pulsed laser deposition of erbium-doped oxyfluoride-silicate glass

2005 ◽  
Vol 41 (25) ◽  
pp. 1376 ◽  
Author(s):  
R.R. Thomson ◽  
H.T. Bookey ◽  
A.K. Kar ◽  
M.R. Taghizadeh ◽  
A. Klini ◽  
...  
Keyword(s):  
Pulsed Laser Deposition ◽  
Silicate Glass ◽  
Pulsed Laser ◽  
Laser Deposition ◽  
Erbium Doped ◽  
Waveguide Fabrication

Epitaxy of Erbium Doped LiNbO3 Films Produced by Pulsed Laser Deposition

1994 ◽  
Vol 341 ◽  
Author(s):  
S. Bauer ◽  
L. Beckers ◽  
M. Fleuster ◽  
J. Schubert ◽  
W. Zander ◽  
...  
Keyword(s):  
Pulsed Laser Deposition ◽  
Pulsed Laser ◽  
Laser Deposition ◽  
X Ray Diffraction ◽  
X Ray ◽  
Erbium Doped ◽  
Film Preparation ◽  
Er Doped ◽  
Secondary Ion

AbstractThe growth of thin films of LiNbO3 and Er:LiNbO3 on LiNbO3 single crystals produced by pulsed laser deposition (PLD) was studied. Samples were characterized by RBS/Channeling Spectrometry, X-ray diffraction measurements, Secondary Ion Mass Spectroscopy (SIMS) and photoluminescence (PL) measurements. Film preparation is performed in a two-step process including deposition and in-situ-annealing. Buried Er doped layers of approx. 800 nm thickness were grown.

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