Nephelometer for determination of the Mueller matrix optical properties of objects

2003 ◽  
Author(s):  
Viacheslav A. Dlugunovich ◽  
L. N. Nasennik ◽  
Valerii N. Snopko ◽  
Aleh V. Tsaruk
Keyword(s):  
Optical Properties ◽  
Mueller Matrix

scholarly journals Optical Characterization of Ultra-Thin Films of Azo-Dye-Doped Polymers Using Ellipsometry and Surface Plasmon Resonance Spectroscopy

Photonics ◽  
2021 ◽  
Vol 8 (2) ◽  
pp. 41
Author(s):  
Najat Andam ◽  
Siham Refki ◽  
Hidekazu Ishitobi ◽  
Yasushi Inouye ◽  
Zouheir Sekkat
Keyword(s):  
Refractive Index ◽  
Optical Properties ◽  
Surface Plasmon Resonance ◽  
Surface Plasmon ◽  
Spectroscopic Ellipsometry ◽  
Plasmon Resonance ◽  
Complex Refractive Index ◽  
Resonance Spectroscopy ◽  
Doped Polymers

The determination of optical constants (i.e., real and imaginary parts of the complex refractive index (nc) and thickness (d)) of ultrathin films is often required in photonics. It may be done by using, for example, surface plasmon resonance (SPR) spectroscopy combined with either profilometry or atomic force microscopy (AFM). SPR yields the optical thickness (i.e., the product of nc and d) of the film, while profilometry and AFM yield its thickness, thereby allowing for the separate determination of nc and d. In this paper, we use SPR and profilometry to determine the complex refractive index of very thin (i.e., 58 nm) films of dye-doped polymers at different dye/polymer concentrations (a feature which constitutes the originality of this work), and we compare the SPR results with those obtained by using spectroscopic ellipsometry measurements performed on the same samples. To determine the optical properties of our film samples by ellipsometry, we used, for the theoretical fits to experimental data, Bruggeman’s effective medium model for the dye/polymer, assumed as a composite material, and the Lorentz model for dye absorption. We found an excellent agreement between the results obtained by SPR and ellipsometry, confirming that SPR is appropriate for measuring the optical properties of very thin coatings at a single light frequency, given that it is simpler in operation and data analysis than spectroscopic ellipsometry.

scholarly journals Universal Synthesizer of Mueller Matrices Based on the Symmetry Properties of the Enpolarizing Ellipsoid

Symmetry ◽  
2021 ◽  
Vol 13 (6) ◽  
pp. 983
Author(s):  
José J. Gil ◽  
Ignacio San José
Keyword(s):  
Mathematical Structure ◽  
Mueller Matrix ◽  
Morphological Properties ◽  
Nondestructive Analysis ◽  
Structural Decomposition ◽  
Symmetry Properties ◽  
Mueller Matrices ◽  
Scattering Measurement ◽  
The Way

Polarimetry is today a widely used and powerful tool for nondestructive analysis of the structural and morphological properties of a great variety of material samples, including aerosols and hydrosols, among many others. For each given scattering measurement configuration, absolute Mueller polarimeters provide the most complete polarimetric information, intricately encoded in the 16 parameters of the corresponding Mueller matrix. Thus, the determination of the mathematical structure of the polarimetric information contained in a Mueller matrix constitutes a topic of great interest. In this work, besides a structural decomposition that makes explicit the role played by the diattenuation-polarizance of a general depolarizing medium, a universal synthesizer of Muller matrices is developed. This is based on the concept of an enpolarizing ellipsoid, whose symmetry features are directly linked to the way in which the polarimetric information is organized.

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