Vibration analysis of layered structures by digital local correlation of laser speckle

2003 ◽  
Author(s):  
Giuseppe Schirripa Spagnolo ◽  
Raffaele Majo ◽  
Emanuele Spiteri ◽  
Dario Ambrosini ◽  
Domenica Paoletti
Keyword(s):  
Vibration Analysis ◽  
Layered Structures ◽  
Laser Speckle ◽  
Local Correlation

scholarly journals Changes in Laser Speckle as a Tool for Vibration Analysis

1970 ◽  
Vol 48 (1A) ◽  
pp. 81-81
Author(s):  
Nils Fernelius ◽  
Conrad Tome
Keyword(s):  
Vibration Analysis ◽  
Laser Speckle

Vibration analysis of layered structures by optoelectronics methods

2002 ◽  
Author(s):  
Giuseppe S. Spagnolo ◽  
Massimo Pappalardo ◽  
Antonio Iula ◽  
Riccardo Carotenuto ◽  
Raffaele Majo ◽  
...  
Keyword(s):  
Vibration Analysis ◽  
Layered Structures

Use of Changes in Laser Speckle for Vibration Analysis

1970 ◽  
Vol 41 (5) ◽  
pp. 2252-2253 ◽  
Author(s):  
Nils Fernelius ◽  
Conrad Tome
Keyword(s):  
Vibration Analysis ◽  
Laser Speckle

Application of Laser Vibrometry to Vibration Measurement on Rotating Components

1995 ◽  
Author(s):  
Steven J. Rothberg ◽  
Neil A. Halliwell
Keyword(s):  
Vibration Analysis ◽  
Laser Speckle ◽  
Vibration Measurement ◽  
Torsional Vibrations ◽  
Radial Vibration ◽  
Laser Vibrometry ◽  
Laser Doppler Vibrometry ◽  
Vibration Measurements ◽  
Speed Fluctuations ◽  
Fundamental Limitation

Abstract This paper describes the application of Laser Doppler Vibrometry to vibration measurements on rotating targets. The noise generating mechanism of the laser speckle phenomenon is first explained before confirmation of the insensitivity of measurements to target shape. The principal focus of the paper is on the fundamental limitation associated with the use of Laser Vibrometers for radial vibration measurements directly on rotating components. In such measurements significant cross-sensitivities to speed fluctuations, including torsional vibrations, and in-plane vibrations are evident, preventing synchronous vibration analysis. Mathematical and electronic means to resolve the correct orthogonal vibration components are presented and shown to be successful in enabling the use of Laser Vibrometry for non-synchronous vibration measurements.

Effect of high pressure-temperature on silicon layered structures as determined by X-ray diffraction and electron microscopy

2004 ◽  
Vol 27 (1-3) ◽  
pp. 415-418
Author(s):  
J. Bak-Misiuk ◽  
A. Misiuk ◽  
J. Ratajczak ◽  
A. Shalimov ◽  
I. Antonova ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
High Pressure ◽  
Layered Structures ◽  
X Ray Diffraction ◽  
X Ray
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