Modified moving slit method for determination of laser beam parameters using second moments of the energy (power) distribution

2002 ◽  
Author(s):  
Alexander A. Malyutin ◽  
R. V. Serov
1992 ◽  
Vol 24 (9) ◽  
pp. S927-S949 ◽  
Author(s):  
N. Hodgson ◽  
T. Haase ◽  
R. Kostka ◽  
H. Weber

1991 ◽  
Vol 219 ◽  
Author(s):  
M. Vieira ◽  
R. Martins ◽  
E. Fortunato ◽  
F. Soares ◽  
L. Guimaraes

ABSTRACTThe determination of the ambipolar diffusion length, L*, and the effective lifetime, τ*, in p/i and a-Si:H Schottky barriers (ITO/p/a-Si:H/Al-Si; Cr/a-Si:H/Cr/Ag) have been determined by Flying Spot Technique, FST. This technique consists in the transient analysis of the photocurrent/photopotential induced by a laser beam that moves perpendicularly to the structure with a constant motion ratio, at different velocities. Taking into account the competition between the diffusion/drift velocities of the excess carriers and the velocity of the flying spot, it is possible to solve the transport equations and to compute separately L* and τ*, from the asymmetrical distribution responses.


Sign in / Sign up

Export Citation Format

Share Document