Development of new beamsplitter system for real-time high-speed holographic interferometry

1991 ◽  
Author(s):  
Yoshitaka Yamamoto
Keyword(s):  
Real Time ◽  
Holographic Interferometry ◽  
High Speed

Ultra High Speed Real-Time Holographic Interferometry

1979 ◽  
Author(s):  
T. Uyemura ◽  
Y . Yamamoto ◽  
N . Yokoyama ◽  
S. Tochiori
Keyword(s):  
Real Time ◽  
Holographic Interferometry ◽  
High Speed ◽  
Ultra High Speed

Application Of High-Speed Real-Time Holographic Interferometry To Dynamic Testing

1989 ◽  
Author(s):  
Li Yulin ◽  
Ji Zhongying ◽  
Wang Zhengrong ◽  
Kong Yue ◽  
Liu Gaixia
Keyword(s):  
Real Time ◽  
Holographic Interferometry ◽  
High Speed ◽  
Dynamic Testing

High speed interferometric device for real-time correction of aero-optic effects

1995 ◽  
Author(s):  
Rod Clark ◽  
John Karpinsky ◽  
Gregg Borek ◽  
Eric Johnson
Keyword(s):  
Real Time ◽  
High Speed ◽  
Time Correction

Real-time resonant holographic interferometry for combustion and plasma environments

1995 ◽  
Author(s):  
N Brock ◽  
M Brown ◽  
P DeBarber ◽  
M Millard ◽  
J Millerd ◽  
...  
Keyword(s):  
Real Time ◽  
Holographic Interferometry

Electrical Probing and Surface Imaging of Deep Sub-Micron Integrated Circuits

1999 ◽  
Author(s):  
Kenneth Krieg ◽  
Richard Qi ◽  
Douglas Thomson ◽  
Greg Bridges
Keyword(s):  
High Resolution ◽  
Integrated Circuits ◽  
Real Time ◽  
High Speed ◽  
Time Signal ◽  
Surface Imaging ◽  
Atomic Force ◽  
Submicron Structures ◽  
High Resolution Images ◽  
Capacitive Loading

Abstract A contact probing system for surface imaging and real-time signal measurement of deep sub-micron integrated circuits is discussed. The probe fits on a standard probe-station and utilizes a conductive atomic force microscope tip to rapidly measure the surface topography and acquire real-time highfrequency signals from features as small as 0.18 micron. The micromachined probe structure minimizes parasitic coupling and the probe achieves a bandwidth greater than 3 GHz, with a capacitive loading of less than 120 fF. High-resolution images of submicron structures and waveforms acquired from high-speed devices are presented.

Low-Cost High-Speed Techniques for Real-Time Simulation of Power Electronic Systems

2007 ◽  
Author(s):  
R. E. Crosbie ◽  
J. J. Zenor ◽  
R. Bednar ◽  
D. Word ◽  
N. G. Hingorani
Keyword(s):  
Real Time ◽  
High Speed ◽  
Low Cost ◽  
Electronic Systems ◽  
Power Electronic ◽  
Real Time Simulation ◽  
Time Simulation
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