Failure-mode analysis of high-power single-mode 980-nm pump laser diodes

2003 ◽  
Author(s):  
Aland K. Chin ◽  
Zhiping Wang ◽  
Kejian Luo ◽  
Alan Nelson ◽  
Zuntu Xu
Keyword(s):  
Failure Mode ◽  
High Power ◽  
Laser Diodes ◽  
Single Mode ◽  
Pump Laser ◽  
Mode Analysis ◽  
Failure Mode Analysis

Failure Mode Analysis of High-power Laser Diodes by Electroluminescence

2018 ◽  
Vol 39 (2) ◽  
pp. 180-187
Author(s):  
刘启坤 LIU Qi-kun ◽  
孔金霞 KONG Jin-xia ◽  
朱凌妮 ZHU Ling-ni ◽  
熊聪 XIONG Cong ◽  
刘素平 LIU Su-ping ◽  
...  
Keyword(s):  
Failure Mode ◽  
High Power ◽  
Laser Diodes ◽  
Mode Analysis ◽  
High Power Laser ◽  
Power Laser ◽  
Failure Mode Analysis

Failure mode analysis of high-power laser diodes

2002 ◽  
Author(s):  
Robert G. Ahrens ◽  
James J. Jaques ◽  
Niloy K. Dutta ◽  
Michael J. LuValle ◽  
Alfonso B. Piccirilli ◽  
...  
Keyword(s):  
Failure Mode ◽  
High Power ◽  
Laser Diodes ◽  
Mode Analysis ◽  
High Power Laser ◽  
Power Laser ◽  
Failure Mode Analysis

1.02-μm pump laser diodes with high power above 300 mW into single mode fiber

1995 ◽  
Author(s):  
Mitsuru Sugo ◽  
Jiro Temmyo ◽  
Teruhiko Nishiya ◽  
Eiichi Kuramochi ◽  
Toshiaki Tamamura
Keyword(s):  
High Power ◽  
Laser Diodes ◽  
Single Mode ◽  
Single Mode Fiber ◽  
Pump Laser

Long-term reliability of high-power single-mode 980-nm pump laser diodes

2003 ◽  
Author(s):  
Kejian Luo ◽  
Aland K. Chin ◽  
Zuntu Xu ◽  
Alan Nelson ◽  
Wei Gao
Keyword(s):  
High Power ◽  
Laser Diodes ◽  
Single Mode ◽  
Pump Laser

Case Study and Fault Modeling for Wrong Redundancy Evaluation on DRAM Devices

2007 ◽  
Author(s):  
Martin Versen ◽  
Dorina Diaconescu ◽  
Jerome Touzel
Keyword(s):  
Failure Mode ◽  
Failure Modes ◽  
Fault Modeling ◽  
Mode Analysis ◽  
Root Cause ◽  
Failure Mode Analysis

Abstract The characterization of failure modes of DRAM is often straight forward if array related hard failures with specific addresses for localization are concerned. The paper presents a case study of a bitline oriented failure mode connected to a redundancy evaluation in the DRAM periphery. The failure mode analysis and fault modeling focus both on the root-cause and on the test aspects of the problem.

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