Characterization of the near-field profile of semiconductor lasers and the spot size of tightly focused laser beams from far-field measurements

2003 ◽  
Author(s):  
Jeffrey L. Guttman ◽  
John M. Fleischer
Keyword(s):  
Semiconductor Lasers ◽  
Near Field ◽  
Field Measurements ◽  
Spot Size ◽  
Laser Beams ◽  
Far Field ◽  
Field Profile ◽  
Focused Laser Beams

Antenna Far Field Reconstruction by a Minimum Near Field Measurements

1984 ◽  
Author(s):  
G. D'Elia ◽  
G. Leone ◽  
R. Pierri ◽  
G. Schirinzi
Keyword(s):  
Near Field ◽  
Field Measurements ◽  
Far Field ◽  
Field Reconstruction

scholarly journals Scattering centers modeling of non-anechoic measurement environments

2012 ◽  
Vol 10 ◽  
pp. 69-73 ◽  
Author(s):  
K. A. Yinusa ◽  
C. H. Schmidt ◽  
T. F. Eibert
Keyword(s):  
Near Field ◽  
Field Measurements ◽  
Field Pattern ◽  
Far Field ◽  
Scattering Centers ◽  
Field Transformation ◽  
Field Radiation ◽  
Echo Suppression ◽  
Multipath Signals ◽  
Far Field Pattern

Abstract. Near-field measurements are established techniques to obtain the far-field radiation pattern of an Antenna Under Test via near-field measurements and subsequent near-field far-field transformation. For measurements acquired in echoic environments, additional post-processing is required to eliminate the effects of multipath signals in the resulting far-field pattern. One of such methods models the measurement environment as a multiple source scenario whereby the collected near-field data is attributed to the AUT and some scattering centers in the vicinity of the AUT. In this way, the contributions of the AUT at the probe can be separated from those of the disturbers during the near-field far-field transformation if the disturber locations are known. In this paper, we present ways of modeling the scattering centers on equivalent surfaces such that echo suppression is possible with only partial or no information about the geometry of the scatterers.

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