Wavefront dislocations and phase object registering inside the airy disk

1991 ◽  
Author(s):  
Vladimir P. Tychinsky ◽  
Alexander V. Tavrov
Keyword(s):  
Phase Object ◽  
Airy Disk

Artefact in 20Å-Resolution Electron Images of Negatively Stained Twodimensional Membrane Protein Crystals

1982 ◽  
Vol 40 ◽  
pp. 92-93
Author(s):  
Douglas L. Dorset ◽  
Barbara Moss
Keyword(s):  
Electron Scattering ◽  
Cross Correlation ◽  
Transmission Function ◽  
Group Symmetry ◽  
Asymmetric Structure ◽  
Object Model ◽  
Phase Object ◽  
Computing Systems ◽  
Resolution Electron ◽  
Plane Group

A number of computing systems devoted to the averaging of electron images of two-dimensional macromolecular crystalline arrays have facilitated the visualization of negatively-stained biological structures. Either by simulation of optical filtering techniques or, in more refined treatments, by cross-correlation averaging, an idealized representation of the repeating asymmetric structure unit is constructed, eliminating image distortions due to radiation damage, stain irregularities and, in the latter approach, imperfections and distortions in the unit cell repeat. In these analyses it is generally assumed that the electron scattering from the thin negativelystained object is well-approximated by a phase object model. Even when absorption effects are considered (i.e. “amplitude contrast“), the expansion of the transmission function, q(x,y)=exp (iσɸ (x,y)), does not exceed the first (kinematical) term. Furthermore, in reconstruction of electron images, kinematical phases are applied to diffraction amplitudes and obey the constraints of the plane group symmetry.

Object Wave Determination by Single-Sideband Methods

1973 ◽  
Vol 31 ◽  
pp. 266-267
Author(s):  
Kenneth H. Downing ◽  
Benjamin M. Siegel
Keyword(s):  
Phase Shift ◽  
Carbon Films ◽  
Object Wave ◽  
Electron Wave ◽  
Phase Object ◽  
Heavy Atoms ◽  
Single Sideband ◽  
Thin Carbon ◽  
Additional Phase Shift ◽  
Additional Phase

Under the “weak phase object” approximation, the component of the electron wave scattered by an object is phase shifted by π/2 with respect to the unscattered component. This phase shift has been confirmed for thin carbon films by many experiments dealing with image contrast and the contrast transfer theory. There is also an additional phase shift which is a function of the atomic number of the scattering atom. This shift is negligible for light atoms such as carbon, but becomes significant for heavy atoms as used for stains for biological specimens. The light elements are imaged as phase objects, while those atoms scattering with a larger phase shift may be imaged as amplitude objects. There is a great deal of interest in determining the complete object wave, i.e., both the phase and amplitude components of the electron wave leaving the object.

A Simple Real-Space Channelling Theory for Electron Diffraction and HREM

1990 ◽  
Vol 48 (1) ◽  
pp. 64-65
Author(s):  
D. Van Dyck
Keyword(s):  
High Resolution ◽  
Electron Diffraction ◽  
Direct Method ◽  
Real Space ◽  
Zone Axis ◽  
Phase Object ◽  
High Resolution Images ◽  
The Many ◽  
Analytical Expressions ◽  
Electron Wavefunction

The computation of the many beam dynamical electron diffraction amplitudes or high resolution images can only be done numerically by using rather sophisticated computer programs so that the physical insight in the diffraction progress is often lost. Furthermore, it is not likely that in this way the inverse problem can be solved exactly, i.e. to reconstruct the structure of the object from the knowledge of the wavefunction at its exit face, as is needed for a direct method [1]. For this purpose, analytical expressions for the electron wavefunction in real or reciprocal space are much more useful. However, the analytical expressions available at present are relatively poor approximations of the dynamical scattering which are only valid either for thin objects ((weak) phase object approximation, thick phase object approximation, kinematical theory) or when the number of beams is very limited (2 or 3). Both requirements are usually invalid for HREM of crystals. There is a need for an analytical expression of the dynamical electron wavefunction which applies for many beam diffraction in thicker crystals. It is well known that, when a crystal is viewed along a zone axis, i.e. parallel to the atom columns, the high resolution images often show a one-to-one correspondence with the configuration of columns provided the distance between the columns is large enough and the resolution of the instrument is sufficient. This is for instance the case in ordered alloys with a column structure [2,3]. From this, it can be suggested that, for a crystal viewed along a zone axis with sufficient separation between the columns, the wave function at the exit face does mainly depend on the projected structure, i.e. on the type of atom columns. Hence, the classical picture of electrons traversing the crystal as plane-like waves in the directions of the Bragg beams which historically stems from the X-ray diffraction picture, is in fact misleading.

Investigation on nonlinear dynamics of ZnO using time-resolved pump-probe technique with phase object

2011 ◽  
Author(s):  
Lirong Ge ◽  
Min Shui ◽  
Xiao Jin ◽  
Zhongguo Li ◽  
Yinglin Song
Keyword(s):  
Nonlinear Dynamics ◽  
Phase Object ◽  
Time Resolved ◽  
Pump Probe ◽  
Probe Technique

Novel method to examine phase object by the use of TFT-LCD

2010 ◽  
Author(s):  
Rongli Guo ◽  
Baoli Yao ◽  
Jun Han ◽  
Xun Yu ◽  
Liang Nie ◽  
...  
Keyword(s):  
Phase Object ◽  
Novel Method

Probing of a random phase object by a focused spatially modulated laser beam. Integral scanning method

1999 ◽  
Vol 25 (12) ◽  
pp. 971-973 ◽  
Author(s):  
V. P. Ryabukho ◽  
A. A. Chausskii ◽  
A. E. Grinevich
Keyword(s):  
Laser Beam ◽  
Random Phase ◽  
Phase Object ◽  
Scanning Method

Performance comparison of amplitude object and phase object recording in LiNbO 3 crystal

2007 ◽  
Author(s):  
Ching Yang Lin ◽  
Ming Chan Wu ◽  
Jung-Ping Liu ◽  
Hon-Fai Yau
Keyword(s):  
Performance Comparison ◽  
Phase Object

Quantitative measurement of a phase object by fringe scanning interference microscopy

1989 ◽  
Vol 28 (9) ◽  
pp. 1615 ◽  
Author(s):  
Jun Chen ◽  
Naoshi Baba ◽  
Kazumi Murata
Keyword(s):  
Quantitative Measurement ◽  
Interference Microscopy ◽  
Phase Object

A spatial filter for phase object differentiation

1976 ◽  
Vol 17 (3) ◽  
pp. 231-233 ◽  
Author(s):  
Bruce A. Horwitz
Keyword(s):  
Spatial Filter ◽  
Phase Object
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