Studies of behavior of hydrogen in fused silica by ion beam analysis technique

2002 ◽  
Author(s):  
Shinji Nagata ◽  
Bun Tsuchiya ◽  
K. Toh ◽  
N. Ohtsu ◽  
Tsunemi Kakuta ◽  
...  
Keyword(s):  
Ion Beam ◽  
Fused Silica ◽  
Ion Beam Analysis ◽  
Analysis Technique ◽  
Beam Analysis

scholarly journals Analysis of Spices Available in Local Market in Bangladesh Using Ion Beam Analysis Technique

2016 ◽  
Vol 10 (09) ◽  
pp. 44-47
Author(s):  
Shirin Akter ◽  
Rajada Khatun ◽  
M. Monjur Ahasan ◽  
Md. Joynal Abedin ◽  
Md. Fakhar Uddin ◽  
...  
Keyword(s):  
Ion Beam ◽  
Local Market ◽  
Ion Beam Analysis ◽  
Analysis Technique ◽  
Beam Analysis

Extended Damage Depth Determinations in AR- and H-Implanted Silica Glass

1993 ◽  
Vol 316 ◽  
Author(s):  
G.W. Arnold ◽  
G. Battaglin ◽  
P. Mazzoldi
Keyword(s):  
Silica Glass ◽  
Ion Beam ◽  
Fused Silica ◽  
Rutherford Backscattering ◽  
High Fluence ◽  
Elastic Recoil ◽  
Ion Beam Analysis ◽  
Elastic Recoil Detection ◽  
Beam Analysis ◽  
Damage Depth

ABSTRACTDamage depths for Ar-implanted fused silica have been examined by Rutherford backscattering (RBS) and elastic recoil detection (ERD) ion-beam analysis. H incursion (6 at. %) from ambient atmospheres to twice TRIM values was found for damage depths which intersected the surface. H implants were used to decorate Ar damage for deeper Ar implants. The incursion of H for high-fluence implants is important for optoelectronic applications.

scholarly journals Evaluation of the sub-surface morphology and composition of gunshot residue using focussed ion beam analysis

2019 ◽  
Vol 297 ◽  
pp. 100-110 ◽  
Author(s):  
Nick Lucas ◽  
Kelsey E. Seyfang ◽  
Andrew Plummer ◽  
Michael Cook ◽  
K. Paul Kirkbride ◽  
...  
Keyword(s):  
Surface Morphology ◽  
Ion Beam ◽  
Gunshot Residue ◽  
Ion Beam Analysis ◽  
Beam Analysis ◽  
Focussed Ion Beam

scholarly journals A New High-Throughput Focused MeV Ion-Beam Analysis Setup

Instruments ◽  
2021 ◽  
Vol 5 (1) ◽  
pp. 10
Author(s):  
Sören Möller ◽  
Daniel Höschen ◽  
Sina Kurth ◽  
Gerwin Esser ◽  
Albert Hiller ◽  
...  
Keyword(s):  
Gamma Ray ◽  
Rutherford Backscattering Spectrometry ◽  
Ion Beam ◽  
Complete Analysis ◽  
Nuclear Reaction Analysis ◽  
Beam Optics ◽  
Single Measurement ◽  
Ion Beam Analysis ◽  
Beam Analysis ◽  
Technical Solutions

The analysis of material composition by ion-beam analysis (IBA) is becoming a standard method, similar to electron microscopy. A pool of IBA methods exists, from which the combination of particle-induced-X-ray emission (PIXE), particle induced gamma-ray analysis (PIGE), nuclear-reaction-analysis (NRA), and Rutherford-backscattering-spectrometry (RBS) provides the most complete analysis over the whole periodic table in a single measurement. Yet, for a highly resolved and accurate IBA analysis, a sophisticated technical setup is required integrating the detectors, beam optics, and sample arrangement. A new end-station developed and installed in Forschungszentrum Jülich provides these capabilities in combination with high sample throughput and result accuracy. Mechanical tolerances limit the device accuracy to 3% for RBS. Continuous pumping enables 5*10−8 mbar base pressure with vibration amplitudes < 0.1 µm. The beam optics achieves a demagnification of 24–34, suitable for µ-beam analysis. An in-vacuum manipulator enables scanning 50 × 50 mm² sample areas with 10 nm accuracy. The setup features the above-mentioned IBA detectors, enabling a broad range of analysis applications such as the operando analysis of batteries or the post-mortem analysis of plasma-exposed samples with up to 3000 discrete points per day. Custom apertures and energy resolutions down to 11 keV enable separation of Fe and Cr in RBS. This work presents the technical solutions together with the quantification of these challenges and their success in the form of a technical reference.

Characterization of GaAs[sub 1−x]N[sub x] epitaxial layers by ion beam analysis

2004 ◽  
Vol 22 (3) ◽  
pp. 908 ◽  
Author(s):  
P. Wei ◽  
M. Chicoine ◽  
S. Gujrathi ◽  
F. Schiettekatte ◽  
J.-N. Beaudry ◽  
...  
Keyword(s):  
Ion Beam ◽  
Epitaxial Layers ◽  
Ion Beam Analysis ◽  
Beam Analysis
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