Multipulsed digital holography applied to full 3D measurements of dynamic events

2001 ◽  
Author(s):  
Fernando Mendoza Santoyo ◽  
Giancarlo Pedrini ◽  
Staffan Schedin ◽  
Hans J. Tiziani
Keyword(s):  
Digital Holography ◽  
3D Measurements ◽  
Dynamic Events

scholarly journals Endoscopic pulsed digital holography for 3D measurements

2006 ◽  
Vol 14 (4) ◽  
pp. 1468 ◽  
Author(s):  
A. Tonatiuh Saucedo ◽  
Fernando Mendoza Santoyo ◽  
Manuel De la Torre-Ibarra ◽  
Giancarlo Pedrini ◽  
Wolfgang Osten
Keyword(s):  
Digital Holography ◽  
3D Measurements

Digital holography with a set of two close wavelengths for height measurement of solder bumps

2020 ◽  
Vol 59 (SO) ◽  
pp. SOOE03
Author(s):  
Hiroyuki Ishigaki ◽  
Takahiro Mamiya ◽  
Yoshio Hayasaki
Keyword(s):  
Digital Holography ◽  
Height Measurement ◽  
Solder Bumps

Development of 72K Ultra-High-Resolution SLMoG system for high-capacity digital holography image

2019 ◽  
pp. 952
Author(s):  
Jae-Eun Pi ◽  
Ji-Hun Choi ◽  
Jong-Heon Yang ◽  
Chi-Young Hwang ◽  
Gi Heon Kim ◽  
...  
Keyword(s):  
High Resolution ◽  
Digital Holography ◽  
High Capacity

scholarly journals Combined Reduced Phase Dual-Directional Illumination Digital Holography and Speckle Displacements for Shape Measurement

2019 ◽  
Vol 2019 ◽  
pp. 1-6
Author(s):  
Davood Khodadad
Keyword(s):  
Phase Difference ◽  
Digital Holography ◽  
Relative Phase ◽  
Groove Depth ◽  
Phase Unwrapping ◽  
Shape Measurement ◽  
Phase Ambiguity ◽  
Holographic Method ◽  
Height Range ◽  
Phase Differences

We present a digital holographic method to increase height range measurement with a reduced phase ambiguity using a dual-directional illumination. Small changes in the angle of incident illumination introduce phase differences between the recorded complex fields. We decrease relative phase difference between the recorded complex fields 279 and 139 times by changing the angle of incident 0.5° and 1°, respectively. A two cent Euro coin edge groove is used to measure the shape. The groove depth is measured as ≈300  μm. Further, numerical refocusing and analysis of speckle displacements in two different planes are used to measure the depth without a use of phase unwrapping process.

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