Feature-shape and line-edge roughness measurement of deep submicron lithographic structures using small-angle neutron scattering

Author(s):  
Eric K. Lin ◽  
Wen-li Wu ◽  
Qinghuang Lin ◽  
Marie Angelopoulos
2002 ◽  
Author(s):  
Eric K. Lin ◽  
Ronald L. Jones ◽  
Wen-li Wu ◽  
John G. Barker ◽  
Patrick J. Bolton ◽  
...  

2003 ◽  
Vol 94 (5) ◽  
pp. 564-571 ◽  
Author(s):  
Michael Vogel ◽  
Oliver Kraft ◽  
Peter Staron ◽  
Helmut Clemens ◽  
Rainer Rauh ◽  
...  

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