Fully complex filter implementation in all-optical and hybrid digital/optical correlators

Mapping Intimacies ◽

10.1117/12.421148 ◽

2001 ◽

Author(s):

Philip M. Birch ◽

Rupert C. D. Young ◽

Frederic Claret-Tournier ◽

Triantafillos Koukoulas ◽

Sovira Tan ◽

...

Keyword(s):

Complex Filter ◽

All Optical ◽

Optical Correlators

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Computer-generated complex filter for an all-optical and a digital-optical hybrid correlator

Optical Engineering ◽

10.1117/1.1425785 ◽

2002 ◽

Vol 41 (1) ◽

pp. 105 ◽

Cited By ~ 7

Author(s):

Philip Birch

Keyword(s):

Complex Filter ◽

All Optical

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Demonstration of multi-wavelength all-optical header recognition using a PPLN and optical correlators

Proceedings 27th European Conference on Optical Communication (Cat. No.01TH8551) ◽

10.1109/ecoc.2001.989643 ◽

2002 ◽

Cited By ~ 7

Author(s):

D. Gurkan ◽

M.C. Hauer ◽

A.B. Sahin ◽

Z. Pan ◽

S. Lee ◽

...

Keyword(s):

All Optical ◽

Multi Wavelength ◽

Optical Correlators

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Dynamically reconfigurable all-optical correlators to support ultra-fast internet routing

Optical Fiber Communication Conference and Exhibit ◽

10.1109/ofc.2002.1036353 ◽

2003 ◽

Cited By ~ 6

Author(s):

M.C. Hauer ◽

J. McGeehan ◽

J. Touch ◽

P. Kamath ◽

J. Bannister ◽

...

Keyword(s):

Internet Routing ◽

Dynamically Reconfigurable ◽

All Optical ◽

Optical Correlators ◽

Fast Internet

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Correlation analysis of radiation damage

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100108210 ◽

1978 ◽

Vol 36 (1) ◽

pp. 214-215

Author(s):

R. Hegerl ◽

A. Feltynowski ◽

B. Grill

Keyword(s):

Electron Microscopy ◽

Independent Random Variables ◽

Optical Parameters ◽

Bright Field Image ◽

Bright Field ◽

Expectation Value ◽

All Optical ◽

Image Element ◽

Stochastic Series ◽

The Common

Till now correlation functions have been used in electron microscopy for two purposes: a) to find the common origin of two micrographs representing the same object, b) to check the optical parameters e. g. the focus. There is a third possibility of application, if all optical parameters are constant during a series of exposures. In this case all differences between the micrographs can only be caused by different noise distributions and by modifications of the object induced by radiation.Because of the electron noise, a discrete bright field image can be considered as a stochastic series Pm,where i denotes the number of the image and m (m = 1,.., M) the image element. Assuming a stable object, the expectation value of Pm would be Ηm for all images. The electron noise can be introduced by addition of stationary, mutual independent random variables nm with zero expectation and the variance. It is possible to treat the modifications of the object as a noise, too.

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