DQE(f) of an amorphous-silicon flat-panel x-ray detector: detector parameter influences and measurement methodology
2013 ◽
Vol 58
(7)
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pp. 2305-2324
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2003 ◽
Vol 38
(4)
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pp. 212-220
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Keyword(s):
1999 ◽
Vol 46
(3)
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pp. 457-461
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1997 ◽
Vol 32
(7)
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pp. 373-377
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1995 ◽
Vol 15
(4)
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pp. 993-1000
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