Automated alignment of complex optical systems using far-field optimization

2000 ◽  
Author(s):  
Antonio Pires ◽  
Patrick R. Manzo ◽  
Sarma N. Gullapalli ◽  
Alan R. Gayhart ◽  
R. LaBonte ◽  
...  
Keyword(s):  
Optical Systems ◽  
Far Field ◽  
Automated Alignment

Optical systems design used for laser smoothing in far field

2009 ◽  
Author(s):  
Xianying Ge ◽  
Tian Lan ◽  
Yinchao Zhang ◽  
Guoqiang Ni
Keyword(s):  
Systems Design ◽  
Optical Systems ◽  
Far Field

Automated alignment for free-space optical systems based on micro-optical-electro-mechanical systems

2003 ◽  
Author(s):  
John A. Neff ◽  
Jianglong Zhang ◽  
Adisorn Tuantranont ◽  
Yijing Fu ◽  
Yung-Cheng Lee ◽  
...  
Keyword(s):  
Free Space ◽  
Mechanical Systems ◽  
Optical Systems ◽  
Free Space Optical ◽  
Automated Alignment ◽  
Space Optical Systems

Automated alignment of complex optical systems using a simplex optimization algorithm

1993 ◽  
Author(s):  
Louis J. Palumbo ◽  
Mark A. Smith ◽  
Michelle A. Thomas ◽  
Alex Ballantyne ◽  
William J. Buitenhuys ◽  
...  
Keyword(s):  
Optimization Algorithm ◽  
Optical Systems ◽  
Simplex Optimization ◽  
Automated Alignment ◽  
Simplex Optimization Algorithm

Possible applications of fraunhofer holography in high resolution electron microscopy

1978 ◽  
Vol 36 (1) ◽  
pp. 222-223 ◽  
Author(s):  
N. Bonnet ◽  
M. Troyon ◽  
P. Gallion
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Transfer Function ◽  
Radiation Damage ◽  
High Resolution Electron Microscopy ◽  
Far Field ◽  
Field Region ◽  
Crystalline Materials ◽  
Resolution Electron ◽  
The Ideal

Two main problems in high resolution electron microscopy are first, the existence of gaps in the transfer function, and then the difficulty to find complex amplitude of the diffracted wawe from registered intensity. The solution of this second problem is in most cases only intended by the realization of several micrographs in different conditions (defocusing distance, illuminating angle, complementary objective apertures…) which can lead to severe problems of contamination or radiation damage for certain specimens.Fraunhofer holography can in principle solve both problems stated above (1,2). The microscope objective is strongly defocused (far-field region) so that the two diffracted beams do not interfere. The ideal transfer function after reconstruction is then unity and the twin image do not overlap on the reconstructed one.We show some applications of the method and results of preliminary tests.Possible application to the study of cavitiesSmall voids (or gas-filled bubbles) created by irradiation in crystalline materials can be observed near the Scherzer focus, but it is then difficult to extract other informations than the approximated size.

Atomic Resolution in Crystal Aperture Stem

1990 ◽  
Vol 48 (1) ◽  
pp. 236-237
Author(s):  
J T Fourie
Keyword(s):  
Optical System ◽  
Spherical Aberration ◽  
Three Dimensional ◽  
Transmission Function ◽  
Optical Systems ◽  
Bragg Angle ◽  
Electron Optical System ◽  
Intimate Contact ◽  
Diffraction Effects ◽  
Design Aspect

The attempts at improvement of electron optical systems to date, have largely been directed towards the design aspect of magnetic lenses and towards the establishment of ideal lens combinations. In the present work the emphasis has been placed on the utilization of a unique three-dimensional crystal objective aperture within a standard electron optical system with the aim to reduce the spherical aberration without introducing diffraction effects. A brief summary of this work together with a description of results obtained recently, will be given.The concept of utilizing a crystal as aperture in an electron optical system was introduced by Fourie who employed a {111} crystal foil as a collector aperture, by mounting the sample directly on top of the foil and in intimate contact with the foil. In the present work the sample was mounted on the bottom of the foil so that the crystal would function as an objective or probe forming aperture. The transmission function of such a crystal aperture depends on the thickness, t, and the orientation of the foil. The expression for calculating the transmission function was derived by Hashimoto, Howie and Whelan on the basis of the electron equivalent of the Borrmann anomalous absorption effect in crystals. In Fig. 1 the functions for a g220 diffraction vector and t = 0.53 and 1.0 μm are shown. Here n= Θ‒ΘB, where Θ is the angle between the incident ray and the (hkl) planes, and ΘB is the Bragg angle.

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